Silicon carbide defects and luminescence centers in current heated 6H-SiC

At room temperature yellow photoluminescence with a broad peak of 2.13 eV is a well-known feature of boron-doped 6H-SiC. Usually yellow luminescence is regarded as recombination involving both the boron-related deep acceptor and donor level. But the nature of the deep level has not been clearly u...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2010
Main Authors: Lee, S.W., Vlaskina, S.I., Vlaskin, V.I., Zaharchenko, I.V., Gubanov, V.A., Mishinova, G.N., Svechnikov, G.S., Rodionov, V.E., Podlasov, S.A.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/117702
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Silicon carbide defects and luminescence centers in current heated 6H-SiC / S.W. Lee, S.I. Vlaskina, V.I. Vlaskin, I.V. Zaharchenko, V.A. Gubanov, G.N. Mishinova, G.S. Svechnikov, V.E. Rodionov, and S.A. Podlasov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 24-29. — Бібліогр.: 23 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-117702
record_format dspace
spelling Lee, S.W.
Vlaskina, S.I.
Vlaskin, V.I.
Zaharchenko, I.V.
Gubanov, V.A.
Mishinova, G.N.
Svechnikov, G.S.
Rodionov, V.E.
Podlasov, S.A.
2017-05-26T12:18:31Z
2017-05-26T12:18:31Z
2010
Silicon carbide defects and luminescence centers in current heated 6H-SiC / S.W. Lee, S.I. Vlaskina, V.I. Vlaskin, I.V. Zaharchenko, V.A. Gubanov, G.N. Mishinova, G.S. Svechnikov, V.E. Rodionov, and S.A. Podlasov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 24-29. — Бібліогр.: 23 назв. — англ.
1560-8034
PACS 71.55.Gs, 78.55.-m, Cr, 78.60.-b, 78.66.Hf
https://nasplib.isofts.kiev.ua/handle/123456789/117702
At room temperature yellow photoluminescence with a broad peak of 2.13 eV is a well-known feature of boron-doped 6H-SiC. Usually yellow luminescence is regarded as recombination involving both the boron-related deep acceptor and donor level. But the nature of the deep level has not been clearly understood yet. We annealed 6H-SiC substrates by current in vacuum without boron injection at the temperature of 1350 and 1500 ºC. We received red and yellow luminescence in PL spectrum for the heated 6H-SiC. The luminescence was regarded as donor-acceptor pair recombination involving the deep aluminum acceptor related to the adjacent carbon vacancies and nitrogen donor or the formation of quantum well like regions of 3C-SiC in 6H-SiC matrix.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Silicon carbide defects and luminescence centers in current heated 6H-SiC
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Silicon carbide defects and luminescence centers in current heated 6H-SiC
spellingShingle Silicon carbide defects and luminescence centers in current heated 6H-SiC
Lee, S.W.
Vlaskina, S.I.
Vlaskin, V.I.
Zaharchenko, I.V.
Gubanov, V.A.
Mishinova, G.N.
Svechnikov, G.S.
Rodionov, V.E.
Podlasov, S.A.
title_short Silicon carbide defects and luminescence centers in current heated 6H-SiC
title_full Silicon carbide defects and luminescence centers in current heated 6H-SiC
title_fullStr Silicon carbide defects and luminescence centers in current heated 6H-SiC
title_full_unstemmed Silicon carbide defects and luminescence centers in current heated 6H-SiC
title_sort silicon carbide defects and luminescence centers in current heated 6h-sic
author Lee, S.W.
Vlaskina, S.I.
Vlaskin, V.I.
Zaharchenko, I.V.
Gubanov, V.A.
Mishinova, G.N.
Svechnikov, G.S.
Rodionov, V.E.
Podlasov, S.A.
author_facet Lee, S.W.
Vlaskina, S.I.
Vlaskin, V.I.
Zaharchenko, I.V.
Gubanov, V.A.
Mishinova, G.N.
Svechnikov, G.S.
Rodionov, V.E.
Podlasov, S.A.
publishDate 2010
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description At room temperature yellow photoluminescence with a broad peak of 2.13 eV is a well-known feature of boron-doped 6H-SiC. Usually yellow luminescence is regarded as recombination involving both the boron-related deep acceptor and donor level. But the nature of the deep level has not been clearly understood yet. We annealed 6H-SiC substrates by current in vacuum without boron injection at the temperature of 1350 and 1500 ºC. We received red and yellow luminescence in PL spectrum for the heated 6H-SiC. The luminescence was regarded as donor-acceptor pair recombination involving the deep aluminum acceptor related to the adjacent carbon vacancies and nitrogen donor or the formation of quantum well like regions of 3C-SiC in 6H-SiC matrix.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/117702
citation_txt Silicon carbide defects and luminescence centers in current heated 6H-SiC / S.W. Lee, S.I. Vlaskina, V.I. Vlaskin, I.V. Zaharchenko, V.A. Gubanov, G.N. Mishinova, G.S. Svechnikov, V.E. Rodionov, and S.A. Podlasov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 24-29. — Бібліогр.: 23 назв. — англ.
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