APA (7th ed.) Citation

Bratus, O., Evtukh, A., Lytvyn, O., Voitovych, M., & Yukhymchuk, V. (2011). Structural properties of nanocomposite SiO₂(Si) films obtained by ion-plasma sputtering and thermal annealing. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Bratus, O.L, A.A Evtukh, O.S Lytvyn, M.V Voitovych, and V.О Yukhymchuk. "Structural Properties of Nanocomposite SiO₂(Si) Films Obtained by Ion-plasma Sputtering and Thermal Annealing." Semiconductor Physics Quantum Electronics & Optoelectronics 2011.

MLA (8th ed.) Citation

Bratus, O.L, et al. "Structural Properties of Nanocomposite SiO₂(Si) Films Obtained by Ion-plasma Sputtering and Thermal Annealing." Semiconductor Physics Quantum Electronics & Optoelectronics, 2011.

Warning: These citations may not always be 100% accurate.