8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions

In this paper the results of photoluminescence researches devoted to phase transitions in 6H-3C-SiC have been presented. High pure 6H-SiC crystals grown by Tairov’s method with and without polytype joint before and after plastic deformation at high temperature annealing were investigated using op...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2013
Hauptverfasser: Vlaskina, S.I., Mishinova, G.N., Vlaskin, V.I., Rodionov, V.E., Svechnikov, G.S.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2013
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/117728
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Zitieren:8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions / S.I. Vlaskina, G.N. Mishinova, V.I. Vlaskin, V.E. Rodionov, G.S. Svechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 273-279. — Бібліогр.: 26 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-117728
record_format dspace
spelling Vlaskina, S.I.
Mishinova, G.N.
Vlaskin, V.I.
Rodionov, V.E.
Svechnikov, G.S.
2017-05-26T13:45:10Z
2017-05-26T13:45:10Z
2013
8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions / S.I. Vlaskina, G.N. Mishinova, V.I. Vlaskin, V.E. Rodionov, G.S. Svechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 273-279. — Бібліогр.: 26 назв. — англ.
1560-8034
PACS 64.70.K-, 78.60.Lc
https://nasplib.isofts.kiev.ua/handle/123456789/117728
In this paper the results of photoluminescence researches devoted to phase transitions in 6H-3C-SiC have been presented. High pure 6H-SiC crystals grown by Tairov’s method with and without polytype joint before and after plastic deformation at high temperature annealing were investigated using optical spectroscopy. Low temperature photoluminescence changes in the transition phase of SiC crystal represented with the stalking fault spectra within the temperature range 4.2 to 35 K. The stalking fault spectra indicate formation of metastable nanostructures in SiC crystals (14H₁ <4334>, 10H₂ <55>, 14H₂ <77>). The phononless part of each stalking fault spectrum consists of two components of radiative recombination that are responsible for hexagonal and cubic arrangement of atoms. Each of radiative recombination components in the stalking fault spectrum has the width of entire band 34 meV and shifts relative to each other by 26 meV. The overlap area of those components equals to 8 meV. The super-fine structure of the recombination components in spectrum is observed, and it is related to different Si – Si or C – C and Si – C bonds. Behavior of all the stalking fault spectra is similar (temperature, decay of luminescence). The processes of the phase transition are explained by the mechanism of interfacial rearrangements in the SiC crystals.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title 8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions
spellingShingle 8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions
Vlaskina, S.I.
Mishinova, G.N.
Vlaskin, V.I.
Rodionov, V.E.
Svechnikov, G.S.
title_short 8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions
title_full 8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions
title_fullStr 8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions
title_full_unstemmed 8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions
title_sort 8h-, 10h-, 14h-sic formation in 6h-3c silicon carbide phase transitions
author Vlaskina, S.I.
Mishinova, G.N.
Vlaskin, V.I.
Rodionov, V.E.
Svechnikov, G.S.
author_facet Vlaskina, S.I.
Mishinova, G.N.
Vlaskin, V.I.
Rodionov, V.E.
Svechnikov, G.S.
publishDate 2013
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description In this paper the results of photoluminescence researches devoted to phase transitions in 6H-3C-SiC have been presented. High pure 6H-SiC crystals grown by Tairov’s method with and without polytype joint before and after plastic deformation at high temperature annealing were investigated using optical spectroscopy. Low temperature photoluminescence changes in the transition phase of SiC crystal represented with the stalking fault spectra within the temperature range 4.2 to 35 K. The stalking fault spectra indicate formation of metastable nanostructures in SiC crystals (14H₁ <4334>, 10H₂ <55>, 14H₂ <77>). The phononless part of each stalking fault spectrum consists of two components of radiative recombination that are responsible for hexagonal and cubic arrangement of atoms. Each of radiative recombination components in the stalking fault spectrum has the width of entire band 34 meV and shifts relative to each other by 26 meV. The overlap area of those components equals to 8 meV. The super-fine structure of the recombination components in spectrum is observed, and it is related to different Si – Si or C – C and Si – C bonds. Behavior of all the stalking fault spectra is similar (temperature, decay of luminescence). The processes of the phase transition are explained by the mechanism of interfacial rearrangements in the SiC crystals.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/117728
citation_txt 8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions / S.I. Vlaskina, G.N. Mishinova, V.I. Vlaskin, V.E. Rodionov, G.S. Svechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 273-279. — Бібліогр.: 26 назв. — англ.
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