Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions
The scattering field gradient maps of surface layer magnetic domains in
 Y₂.₉₅La₀.₀₅Fe₅O₁₂ iron-yttrium garnet modified by high-dose ion implantation with
 nitrogen ions N+
 were obtained by the method of magnetic force microscopy. It was
 found that improving the ma...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2013 |
| Hauptverfasser: | , , , , , , , , |
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| Sprache: | Englisch |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2013
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/117733 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Magnetic force microscopy of YLaFeO films implanted
 by high dose of nitrogen ions / І.M. Fodchuk, I.I. Gutsuliak, R.A. Zaplitniy, S.V. Balovsyak, І.P. Yaremiy, О.Yu. Bonchyk, G.V. Savitskiy, І.M. Syvorotka, P.M. Lytvyn // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 246-252. — Бібліогр.: 24 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862737652497776640 |
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| author | Fodchuk, I.M. Gutsuliak, I.I. Zaplitniy, R.A. Balovsyak, S.V. Yaremiy, I.P. Bonchyk, O.Yu. Savitskiy, G.V. Syvorotka, I.M. Lytvyn, P.M. |
| author_facet | Fodchuk, I.M. Gutsuliak, I.I. Zaplitniy, R.A. Balovsyak, S.V. Yaremiy, I.P. Bonchyk, O.Yu. Savitskiy, G.V. Syvorotka, I.M. Lytvyn, P.M. |
| citation_txt | Magnetic force microscopy of YLaFeO films implanted
 by high dose of nitrogen ions / І.M. Fodchuk, I.I. Gutsuliak, R.A. Zaplitniy, S.V. Balovsyak, І.P. Yaremiy, О.Yu. Bonchyk, G.V. Savitskiy, І.M. Syvorotka, P.M. Lytvyn // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 246-252. — Бібліогр.: 24 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The scattering field gradient maps of surface layer magnetic domains in
Y₂.₉₅La₀.₀₅Fe₅O₁₂ iron-yttrium garnet modified by high-dose ion implantation with
nitrogen ions N+
were obtained by the method of magnetic force microscopy. It was
found that improving the magnetic properties of thin films, which includes reducing the
observed magnetic losses after high-dose implantation, is accompanied by essential
ordering of magnetic domains on the surface of the implanted films. There is a direct
dependence of the magnetic properties on the dose of implanted atoms, accompanied by
a significant dispersion and amorphization of surface layer and formation of a clear
magnetic structure.
|
| first_indexed | 2025-12-07T20:00:25Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-117733 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T20:00:25Z |
| publishDate | 2013 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Fodchuk, I.M. Gutsuliak, I.I. Zaplitniy, R.A. Balovsyak, S.V. Yaremiy, I.P. Bonchyk, O.Yu. Savitskiy, G.V. Syvorotka, I.M. Lytvyn, P.M. 2017-05-26T13:55:26Z 2017-05-26T13:55:26Z 2013 Magnetic force microscopy of YLaFeO films implanted
 by high dose of nitrogen ions / І.M. Fodchuk, I.I. Gutsuliak, R.A. Zaplitniy, S.V. Balovsyak, І.P. Yaremiy, О.Yu. Bonchyk, G.V. Savitskiy, І.M. Syvorotka, P.M. Lytvyn // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 246-252. — Бібліогр.: 24 назв. — англ. 1560-8034 PACS 75.50.Gg https://nasplib.isofts.kiev.ua/handle/123456789/117733 The scattering field gradient maps of surface layer magnetic domains in
 Y₂.₉₅La₀.₀₅Fe₅O₁₂ iron-yttrium garnet modified by high-dose ion implantation with
 nitrogen ions N+
 were obtained by the method of magnetic force microscopy. It was
 found that improving the magnetic properties of thin films, which includes reducing the
 observed magnetic losses after high-dose implantation, is accompanied by essential
 ordering of magnetic domains on the surface of the implanted films. There is a direct
 dependence of the magnetic properties on the dose of implanted atoms, accompanied by
 a significant dispersion and amorphization of surface layer and formation of a clear
 magnetic structure. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions Article published earlier |
| spellingShingle | Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions Fodchuk, I.M. Gutsuliak, I.I. Zaplitniy, R.A. Balovsyak, S.V. Yaremiy, I.P. Bonchyk, O.Yu. Savitskiy, G.V. Syvorotka, I.M. Lytvyn, P.M. |
| title | Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions |
| title_full | Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions |
| title_fullStr | Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions |
| title_full_unstemmed | Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions |
| title_short | Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions |
| title_sort | magnetic force microscopy of ylafeo films implanted by high dose of nitrogen ions |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/117733 |
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