Ultrasonic assisted nanomanipulations with atomic force microscope
Demonstrated experimentally in this work was the possibility of controlled
 handling the nanoparticles with the size from 50 up to 250 nm on a semiconductor
 surface by using an atomic force microscope under conditions of acoustic excitation. It
 has been shown that the se...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Дата: | 2010 |
| Автори: | , , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2010
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/117741 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Ultrasonic assisted nanomanipulations with atomic force microscope / P.M. Lytvyn, O.Ya. Olikh, O.S. Lytvyn, O.M. Dyachyns’ka, I.V. Prokopenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 36-42. — Бібліогр.: 38 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862567612366454784 |
|---|---|
| author | Lytvyn, P.M. Olikh, O.Ya. Lytvyn, O.S. Dyachyns’ka, O.M. Prokopenko, I.V. |
| author_facet | Lytvyn, P.M. Olikh, O.Ya. Lytvyn, O.S. Dyachyns’ka, O.M. Prokopenko, I.V. |
| citation_txt | Ultrasonic assisted nanomanipulations with atomic force microscope / P.M. Lytvyn, O.Ya. Olikh, O.S. Lytvyn, O.M. Dyachyns’ka, I.V. Prokopenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 36-42. — Бібліогр.: 38 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | Demonstrated experimentally in this work was the possibility of controlled
handling the nanoparticles with the size from 50 up to 250 nm on a semiconductor
surface by using an atomic force microscope under conditions of acoustic excitation. It
has been shown that the selective transport of particles of a certain size is possible owing
to the change of an ultrasonic vibration amplitude. Also in this study, possible
mechanisms in which ultrasound may influence the particle-surface interaction and the
probe-particle (surface) interaction have been analyzed.
|
| first_indexed | 2025-11-26T00:18:17Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-117741 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-11-26T00:18:17Z |
| publishDate | 2010 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Lytvyn, P.M. Olikh, O.Ya. Lytvyn, O.S. Dyachyns’ka, O.M. Prokopenko, I.V. 2017-05-26T14:40:56Z 2017-05-26T14:40:56Z 2010 Ultrasonic assisted nanomanipulations with atomic force microscope / P.M. Lytvyn, O.Ya. Olikh, O.S. Lytvyn, O.M. Dyachyns’ka, I.V. Prokopenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 36-42. — Бібліогр.: 38 назв. — англ. 1560-8034 PACS 07.79.Sp, 43.35.-c, 68.37.Ps, 81.16.-c https://nasplib.isofts.kiev.ua/handle/123456789/117741 Demonstrated experimentally in this work was the possibility of controlled
 handling the nanoparticles with the size from 50 up to 250 nm on a semiconductor
 surface by using an atomic force microscope under conditions of acoustic excitation. It
 has been shown that the selective transport of particles of a certain size is possible owing
 to the change of an ultrasonic vibration amplitude. Also in this study, possible
 mechanisms in which ultrasound may influence the particle-surface interaction and the
 probe-particle (surface) interaction have been analyzed. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Ultrasonic assisted nanomanipulations with atomic force microscope Article published earlier |
| spellingShingle | Ultrasonic assisted nanomanipulations with atomic force microscope Lytvyn, P.M. Olikh, O.Ya. Lytvyn, O.S. Dyachyns’ka, O.M. Prokopenko, I.V. |
| title | Ultrasonic assisted nanomanipulations with atomic force microscope |
| title_full | Ultrasonic assisted nanomanipulations with atomic force microscope |
| title_fullStr | Ultrasonic assisted nanomanipulations with atomic force microscope |
| title_full_unstemmed | Ultrasonic assisted nanomanipulations with atomic force microscope |
| title_short | Ultrasonic assisted nanomanipulations with atomic force microscope |
| title_sort | ultrasonic assisted nanomanipulations with atomic force microscope |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/117741 |
| work_keys_str_mv | AT lytvynpm ultrasonicassistednanomanipulationswithatomicforcemicroscope AT olikhoya ultrasonicassistednanomanipulationswithatomicforcemicroscope AT lytvynos ultrasonicassistednanomanipulationswithatomicforcemicroscope AT dyachynskaom ultrasonicassistednanomanipulationswithatomicforcemicroscope AT prokopenkoiv ultrasonicassistednanomanipulationswithatomicforcemicroscope |