Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism

The laser oscillation at room temperature in Cr²⁺:ZnS waveguide thin-film
 structures under electrical pumping with the impact excitation mechanism was first
 discovered after improvement of some waveguide optical properties. However, lasing
 turned out to be unstable and cea...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2011
Hauptverfasser: Vlasenko, N.A., Oleksenko, P.F., Mukhlyo, M.O., Lytvyn, P.M., Veligura, L.I., Denisova, Z.L.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2011
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/117755
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Zitieren:Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism / N.A. Vlasenko, P.F. Oleksenko, M.O. Mukhlyo, P.M. Lytvyn, L.I. Veligura, Z.L. Denisova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 3. — С. 339-343. — Бібліогр.: 16 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Vlasenko, N.A.
Oleksenko, P.F.
Mukhlyo, M.O.
Lytvyn, P.M.
Veligura, L.I.
Denisova, Z.L.
author_facet Vlasenko, N.A.
Oleksenko, P.F.
Mukhlyo, M.O.
Lytvyn, P.M.
Veligura, L.I.
Denisova, Z.L.
citation_txt Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism / N.A. Vlasenko, P.F. Oleksenko, M.O. Mukhlyo, P.M. Lytvyn, L.I. Veligura, Z.L. Denisova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 3. — С. 339-343. — Бібліогр.: 16 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description The laser oscillation at room temperature in Cr²⁺:ZnS waveguide thin-film
 structures under electrical pumping with the impact excitation mechanism was first
 discovered after improvement of some waveguide optical properties. However, lasing
 turned out to be unstable and ceases soon, which is accompanied by strong weakening
 the emission recorded from the waveguide edge whereas the emission from the structure
 face remains intensive. It is shown that the above changes stem from increasing optical
 losses caused by appearance of light scattering in the structure by inhomogeneities
 formed during lasing as a consequence the most probably of recrystallization processes in
 the Cr:ZnS film. Some ways are proposed to improve the lasing stability
first_indexed 2025-12-01T20:34:03Z
format Article
fulltext
id nasplib_isofts_kiev_ua-123456789-117755
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-01T20:34:03Z
publishDate 2011
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Vlasenko, N.A.
Oleksenko, P.F.
Mukhlyo, M.O.
Lytvyn, P.M.
Veligura, L.I.
Denisova, Z.L.
2017-05-26T16:06:51Z
2017-05-26T16:06:51Z
2011
Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism / N.A. Vlasenko, P.F. Oleksenko, M.O. Mukhlyo, P.M. Lytvyn, L.I. Veligura, Z.L. Denisova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 3. — С. 339-343. — Бібліогр.: 16 назв. — англ.
1560-8034
PACS 42.55.-f, 42.79.Gn, 68.55.Ln, 78.60.Fi
https://nasplib.isofts.kiev.ua/handle/123456789/117755
The laser oscillation at room temperature in Cr²⁺:ZnS waveguide thin-film
 structures under electrical pumping with the impact excitation mechanism was first
 discovered after improvement of some waveguide optical properties. However, lasing
 turned out to be unstable and ceases soon, which is accompanied by strong weakening
 the emission recorded from the waveguide edge whereas the emission from the structure
 face remains intensive. It is shown that the above changes stem from increasing optical
 losses caused by appearance of light scattering in the structure by inhomogeneities
 formed during lasing as a consequence the most probably of recrystallization processes in
 the Cr:ZnS film. Some ways are proposed to improve the lasing stability
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism
Article
published earlier
spellingShingle Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism
Vlasenko, N.A.
Oleksenko, P.F.
Mukhlyo, M.O.
Lytvyn, P.M.
Veligura, L.I.
Denisova, Z.L.
title Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism
title_full Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism
title_fullStr Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism
title_full_unstemmed Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism
title_short Laser oscillation in Cr²⁺:ZnS waveguide thin-film structures under electrical pumping with impact excitation mechanism
title_sort laser oscillation in cr²⁺:zns waveguide thin-film structures under electrical pumping with impact excitation mechanism
url https://nasplib.isofts.kiev.ua/handle/123456789/117755
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