APA (7th ed.) Citation

Amer, H., Elkordy, M., Zien, M., Dahshan, A., & Elshamy, R. (2011). Characterization of quaternary chalcogenide As-Ge-Te-Si thin films. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Amer, H.H, M. Elkordy, M. Zien, A. Dahshan, and R.A Elshamy. "Characterization of Quaternary Chalcogenide As-Ge-Te-Si Thin Films." Semiconductor Physics Quantum Electronics & Optoelectronics 2011.

MLA (8th ed.) Citation

Amer, H.H, et al. "Characterization of Quaternary Chalcogenide As-Ge-Te-Si Thin Films." Semiconductor Physics Quantum Electronics & Optoelectronics, 2011.

Warning: These citations may not always be 100% accurate.