Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells

The drift of charge carriers in the p-Si₀.₈₈Ge₀.₁₂/Si heterostructures under strong lateral electric fields and conditions of carrier generation by the band-to-band light absorption has been investigated experimentally. The data of the drift length, drift mobility, and lifetime of charge carriers...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2011
Main Authors: Gudenko1, Yu.M., Vainberg, V.V., Poroshin, V.M., Tulupenko, V.M.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2011
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/117768
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells/ Yu.M. Gudenko, V.V. Vainberg, V.M. Poroshin, V.M. Tulupenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 3. — С. 375-379. — Бібліогр.: 16 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-117768
record_format dspace
spelling Gudenko1, Yu.M.
Vainberg, V.V.
Poroshin, V.M.
Tulupenko, V.M.
2017-05-26T16:31:56Z
2017-05-26T16:31:56Z
2011
Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells/ Yu.M. Gudenko, V.V. Vainberg, V.M. Poroshin, V.M. Tulupenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 3. — С. 375-379. — Бібліогр.: 16 назв. — англ.
1560-8034
PACS 73.21.Fg, 73.50.Gr, Pz
https://nasplib.isofts.kiev.ua/handle/123456789/117768
The drift of charge carriers in the p-Si₀.₈₈Ge₀.₁₂/Si heterostructures under strong lateral electric fields and conditions of carrier generation by the band-to-band light absorption has been investigated experimentally. The data of the drift length, drift mobility, and lifetime of charge carriers within the temperature range 20 to 77 K under the electric field up to 1500 V/cm are presented.
The authors are grateful to Prof. O.G. Sarbey for helpful discussion.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells
spellingShingle Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells
Gudenko1, Yu.M.
Vainberg, V.V.
Poroshin, V.M.
Tulupenko, V.M.
title_short Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells
title_full Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells
title_fullStr Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells
title_full_unstemmed Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells
title_sort lateral drift of photo-generated charge carriers in the p-sige/si heterostructures with quantum wells
author Gudenko1, Yu.M.
Vainberg, V.V.
Poroshin, V.M.
Tulupenko, V.M.
author_facet Gudenko1, Yu.M.
Vainberg, V.V.
Poroshin, V.M.
Tulupenko, V.M.
publishDate 2011
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The drift of charge carriers in the p-Si₀.₈₈Ge₀.₁₂/Si heterostructures under strong lateral electric fields and conditions of carrier generation by the band-to-band light absorption has been investigated experimentally. The data of the drift length, drift mobility, and lifetime of charge carriers within the temperature range 20 to 77 K under the electric field up to 1500 V/cm are presented.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/117768
citation_txt Lateral drift of photo-generated charge carriers in the p-SiGe/Si heterostructures with quantum wells/ Yu.M. Gudenko, V.V. Vainberg, V.M. Poroshin, V.M. Tulupenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 3. — С. 375-379. — Бібліогр.: 16 назв. — англ.
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AT poroshinvm lateraldriftofphotogeneratedchargecarriersinthepsigesiheterostructureswithquantumwells
AT tulupenkovm lateraldriftofphotogeneratedchargecarriersinthepsigesiheterostructureswithquantumwells
first_indexed 2025-12-07T17:00:11Z
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