Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist

Application of inorganic photoresist based on chalcogenide films for fabrication of submicrometer periodic relief on silicon wafers was investigated. For this purpose, technological process of resistive two-layer chalcogenide-Cr mask formation on a silicon surface was developed, and silicon aniso...

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Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2007
Автори: Min’ko, V.I., Shepeliavyi, P.E., Indutnyy, I.Z., Litvin, O.S.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2007
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/117772
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist / V.I. Min'ko, P.E. Shepeliavyi, I.Z. Indutnyy, O.S. Litvin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 1. — С. 40-44. — Бібліогр.: 16 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-117772
record_format dspace
spelling Min’ko, V.I.
Shepeliavyi, P.E.
Indutnyy, I.Z.
Litvin, O.S.
2017-05-26T17:21:29Z
2017-05-26T17:21:29Z
2007
Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist / V.I. Min'ko, P.E. Shepeliavyi, I.Z. Indutnyy, O.S. Litvin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 1. — С. 40-44. — Бібліогр.: 16 назв. — англ.
1560-8034
PACS 42.70.L, 42.40.Ht, 78.20.e
https://nasplib.isofts.kiev.ua/handle/123456789/117772
Application of inorganic photoresist based on chalcogenide films for fabrication of submicrometer periodic relief on silicon wafers was investigated. For this purpose, technological process of resistive two-layer chalcogenide-Cr mask formation on a silicon surface was developed, and silicon anisotropic etching was optimized, too. This technology has been used for the fabrication of high-quality diffraction gratings on Si (100) surface with symmetric triangular and trapezium grooves and two-dimentional periodic structures. Relief parameters and diffraction properties of the obtained structures and their dependences on etching time were determined
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist
spellingShingle Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist
Min’ko, V.I.
Shepeliavyi, P.E.
Indutnyy, I.Z.
Litvin, O.S.
title_short Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist
title_full Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist
title_fullStr Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist
title_full_unstemmed Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist
title_sort fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist
author Min’ko, V.I.
Shepeliavyi, P.E.
Indutnyy, I.Z.
Litvin, O.S.
author_facet Min’ko, V.I.
Shepeliavyi, P.E.
Indutnyy, I.Z.
Litvin, O.S.
publishDate 2007
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Application of inorganic photoresist based on chalcogenide films for fabrication of submicrometer periodic relief on silicon wafers was investigated. For this purpose, technological process of resistive two-layer chalcogenide-Cr mask formation on a silicon surface was developed, and silicon anisotropic etching was optimized, too. This technology has been used for the fabrication of high-quality diffraction gratings on Si (100) surface with symmetric triangular and trapezium grooves and two-dimentional periodic structures. Relief parameters and diffraction properties of the obtained structures and their dependences on etching time were determined
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/117772
fulltext
citation_txt Fabrication of silicon grating structures using interference lithography and chalcogenide inorganic photoresist / V.I. Min'ko, P.E. Shepeliavyi, I.Z. Indutnyy, O.S. Litvin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 1. — С. 40-44. — Бібліогр.: 16 назв. — англ.
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AT indutnyyiz fabricationofsilicongratingstructuresusinginterferencelithographyandchalcogenideinorganicphotoresist
AT litvinos fabricationofsilicongratingstructuresusinginterferencelithographyandchalcogenideinorganicphotoresist
first_indexed 2025-11-24T10:13:24Z
last_indexed 2025-11-24T10:13:24Z
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