The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties

The mechanisms of formation of modified thin-film structures based on GeSe(S)
 systems with different Al, Bi, Pb, Te, In modifiers evaporated in vacuum have
 been determined. The process of their growth and the structure is greatly influenced by
 the vapor composition, energe...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2007
Main Authors: Horvat, G.T., Kondratenko, O.S., Loja, V.Ju., Myholynets, I.M., Rosola, I.J., Jurkovуch, N.V.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2007
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/117775
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties / G.T. Horvat, O.S. Kondratenko, V.Ju. Loja, I.M. Myholynets, I.J. Rosola, N.V. Jurkovуch // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 1. — С. 45-48. — Бібліогр.: 6 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
_version_ 1862535109663522816
author Horvat, G.T.
Kondratenko, O.S.
Loja, V.Ju.
Myholynets, I.M.
Rosola, I.J.
Jurkovуch, N.V.
author_facet Horvat, G.T.
Kondratenko, O.S.
Loja, V.Ju.
Myholynets, I.M.
Rosola, I.J.
Jurkovуch, N.V.
citation_txt The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties / G.T. Horvat, O.S. Kondratenko, V.Ju. Loja, I.M. Myholynets, I.J. Rosola, N.V. Jurkovуch // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 1. — С. 45-48. — Бібліогр.: 6 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description The mechanisms of formation of modified thin-film structures based on GeSe(S)
 systems with different Al, Bi, Pb, Te, In modifiers evaporated in vacuum have
 been determined. The process of their growth and the structure is greatly influenced by
 the vapor composition, energetic state of its particles, the velocity of condensation, the
 temperature of the lining and that of evaporator. The 〈Ge₀.₄S₀.₆:Х〉 (Bi,Pb,In),
 〈Ge₀.₄S₀.₆:In〉 structure is characterized by the mechanism of condensation which is
 realized according to the type: vapor-liquid-solid phase with coalescence. The
 condensation mechanism in 〈Ge₀.₄S₀.₆:Al(Te)〉 structures is realized according to the type
 vapor-solid phase. The roughness of modified Al (2 аt. %), Bi (14 аt. %), Pb (12 аt. %),
 In (1 аt. %, 5 аt. %) structures is 1…13 nm, and for 〈Ge₀.₄S₀.₆:Те〉 (Те is 30.7 аt. %)
 structure reaches ~37 nm. The thickness and optical parameters of modified thin-film
 structures have been determined using the method of multiangular ellipsometry.
first_indexed 2025-11-24T09:08:24Z
format Article
fulltext
id nasplib_isofts_kiev_ua-123456789-117775
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-11-24T09:08:24Z
publishDate 2007
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Horvat, G.T.
Kondratenko, O.S.
Loja, V.Ju.
Myholynets, I.M.
Rosola, I.J.
Jurkovуch, N.V.
2017-05-26T17:24:51Z
2017-05-26T17:24:51Z
2007
The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties / G.T. Horvat, O.S. Kondratenko, V.Ju. Loja, I.M. Myholynets, I.J. Rosola, N.V. Jurkovуch // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 1. — С. 45-48. — Бібліогр.: 6 назв. — англ.
1560-8034
PACS 78.66.-w
https://nasplib.isofts.kiev.ua/handle/123456789/117775
The mechanisms of formation of modified thin-film structures based on GeSe(S)
 systems with different Al, Bi, Pb, Te, In modifiers evaporated in vacuum have
 been determined. The process of their growth and the structure is greatly influenced by
 the vapor composition, energetic state of its particles, the velocity of condensation, the
 temperature of the lining and that of evaporator. The 〈Ge₀.₄S₀.₆:Х〉 (Bi,Pb,In),
 〈Ge₀.₄S₀.₆:In〉 structure is characterized by the mechanism of condensation which is
 realized according to the type: vapor-liquid-solid phase with coalescence. The
 condensation mechanism in 〈Ge₀.₄S₀.₆:Al(Te)〉 structures is realized according to the type
 vapor-solid phase. The roughness of modified Al (2 аt. %), Bi (14 аt. %), Pb (12 аt. %),
 In (1 аt. %, 5 аt. %) structures is 1…13 nm, and for 〈Ge₀.₄S₀.₆:Те〉 (Те is 30.7 аt. %)
 structure reaches ~37 nm. The thickness and optical parameters of modified thin-film
 structures have been determined using the method of multiangular ellipsometry.
The authors express their sincere gratitude to O.S. Lytvyn for her assistance in investigations of the structures by using AFM
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties
Article
published earlier
spellingShingle The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties
Horvat, G.T.
Kondratenko, O.S.
Loja, V.Ju.
Myholynets, I.M.
Rosola, I.J.
Jurkovуch, N.V.
title The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties
title_full The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties
title_fullStr The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties
title_full_unstemmed The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties
title_short The formation mechanism of modified thin-film structures based on Ge-Se(S) systems and its influence on physical properties
title_sort formation mechanism of modified thin-film structures based on ge-se(s) systems and its influence on physical properties
url https://nasplib.isofts.kiev.ua/handle/123456789/117775
work_keys_str_mv AT horvatgt theformationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT kondratenkoos theformationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT lojavju theformationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT myholynetsim theformationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT rosolaij theformationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT jurkovuchnv theformationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT horvatgt formationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT kondratenkoos formationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT lojavju formationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT myholynetsim formationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT rosolaij formationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties
AT jurkovuchnv formationmechanismofmodifiedthinfilmstructuresbasedongesessystemsanditsinfluenceonphysicalproperties