Seebeck’s effect in p-SiGe whisker samples

p-SiGe whisker samples with a diameter of ~40 μm, grown by chemical precipitation from the vapor phase, have been investigated. Temperature dependences of the thermal e.m.f. and conductivity within the temperature interval 20…400 K have been measured. It has been shown that the mobility of holes...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2011
Main Authors: Dolgolenko, A.P., Druzhinin, A.A., Karpenko, A.Ya., Nichkalo, S.I., Ostrovsky, I.P., Litovchenko, P.G., Litovchenko, A.P.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2011
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/117783
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Seebeck’s effect in p-SiGe whisker samples / A.P. Dolgolenko, A.A. Druzhinin, A.Ya. Karpenko, S.I. Nichkalo, I.P. Ostrovsky, P.G. Litovchenko, A.P. Litovchenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 4. — С. 456-460 — Бібліогр.: 6 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-117783
record_format dspace
spelling Dolgolenko, A.P.
Druzhinin, A.A.
Karpenko, A.Ya.
Nichkalo, S.I.
Ostrovsky, I.P.
Litovchenko, P.G.
Litovchenko, A.P.
2017-05-26T17:34:32Z
2017-05-26T17:34:32Z
2011
Seebeck’s effect in p-SiGe whisker samples / A.P. Dolgolenko, A.A. Druzhinin, A.Ya. Karpenko, S.I. Nichkalo, I.P. Ostrovsky, P.G. Litovchenko, A.P. Litovchenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 4. — С. 456-460 — Бібліогр.: 6 назв. — англ.
1560-8034
PACS 72.15.Jf, 72.20.Pa
https://nasplib.isofts.kiev.ua/handle/123456789/117783
p-SiGe whisker samples with a diameter of ~40 μm, grown by chemical precipitation from the vapor phase, have been investigated. Temperature dependences of the thermal e.m.f. and conductivity within the temperature interval 20…400 K have been measured. It has been shown that the mobility of holes in p - SiGe whiskers upon the average is 1.5 times higher than that in bulk p - Si samples. p - SiGe whiskers possess smaller phonon scattering and larger phonon dragging in comparison with the bulk p - Si samples.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Seebeck’s effect in p-SiGe whisker samples
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Seebeck’s effect in p-SiGe whisker samples
spellingShingle Seebeck’s effect in p-SiGe whisker samples
Dolgolenko, A.P.
Druzhinin, A.A.
Karpenko, A.Ya.
Nichkalo, S.I.
Ostrovsky, I.P.
Litovchenko, P.G.
Litovchenko, A.P.
title_short Seebeck’s effect in p-SiGe whisker samples
title_full Seebeck’s effect in p-SiGe whisker samples
title_fullStr Seebeck’s effect in p-SiGe whisker samples
title_full_unstemmed Seebeck’s effect in p-SiGe whisker samples
title_sort seebeck’s effect in p-sige whisker samples
author Dolgolenko, A.P.
Druzhinin, A.A.
Karpenko, A.Ya.
Nichkalo, S.I.
Ostrovsky, I.P.
Litovchenko, P.G.
Litovchenko, A.P.
author_facet Dolgolenko, A.P.
Druzhinin, A.A.
Karpenko, A.Ya.
Nichkalo, S.I.
Ostrovsky, I.P.
Litovchenko, P.G.
Litovchenko, A.P.
publishDate 2011
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description p-SiGe whisker samples with a diameter of ~40 μm, grown by chemical precipitation from the vapor phase, have been investigated. Temperature dependences of the thermal e.m.f. and conductivity within the temperature interval 20…400 K have been measured. It has been shown that the mobility of holes in p - SiGe whiskers upon the average is 1.5 times higher than that in bulk p - Si samples. p - SiGe whiskers possess smaller phonon scattering and larger phonon dragging in comparison with the bulk p - Si samples.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/117783
citation_txt Seebeck’s effect in p-SiGe whisker samples / A.P. Dolgolenko, A.A. Druzhinin, A.Ya. Karpenko, S.I. Nichkalo, I.P. Ostrovsky, P.G. Litovchenko, A.P. Litovchenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 4. — С. 456-460 — Бібліогр.: 6 назв. — англ.
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first_indexed 2025-11-29T13:13:15Z
last_indexed 2025-11-29T13:13:15Z
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