Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions
Bubble-like and crater-like blisters were observed at the boundaries of the
 structures “thin Ni film–lithium niobate” and “thin Pd film–lithium tantalate” implanted
 by Ar⁺
 ions. Analyses of these systems by AFM and SEM have shown that ion
 implantation essentially...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 2010 |
| Main Authors: | , , , , , , , |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2010
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/117822 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions / V.O. Lysiuk, N.L. Moskalenko, V.S. Staschuk, M.I. Kluy, O.V. Vakulenko, I.G. Androsyuk, M.A. Surmach, V.I. Pogoda // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 103-109. — Бібліогр.: 10 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862581305556860928 |
|---|---|
| author | Lysiuk, V.O. Moskalenko, N.L. Staschuk, V.S. Kluy, M.I. Vakulenko, O.V. Androsyuk, I.G. Surmach, M.A. Pogoda, V.I. |
| author_facet | Lysiuk, V.O. Moskalenko, N.L. Staschuk, V.S. Kluy, M.I. Vakulenko, O.V. Androsyuk, I.G. Surmach, M.A. Pogoda, V.I. |
| citation_txt | Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions / V.O. Lysiuk, N.L. Moskalenko, V.S. Staschuk, M.I. Kluy, O.V. Vakulenko, I.G. Androsyuk, M.A. Surmach, V.I. Pogoda // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 103-109. — Бібліогр.: 10 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | Bubble-like and crater-like blisters were observed at the boundaries of the
structures “thin Ni film–lithium niobate” and “thin Pd film–lithium tantalate” implanted
by Ar⁺
ions. Analyses of these systems by AFM and SEM have shown that ion
implantation essentially modifies near-surface structures with changing their optical,
electrical and mechanical properties. Differences in the optical properties and surface
structure between implanted and non-implanted systems are observed and explained by
different properties of materials, widening interface “film–substrate” as well as by other
known effects and phenomena. Enhanced adhesion of these films to substrate,
nonselective spectral response is a base for effective and perspective application of the
systems in development of high-sensitive pyroelectric detectors with a wide spectral
range and high optical damage threshold.
|
| first_indexed | 2025-11-26T21:25:33Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-117822 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-11-26T21:25:33Z |
| publishDate | 2010 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Lysiuk, V.O. Moskalenko, N.L. Staschuk, V.S. Kluy, M.I. Vakulenko, O.V. Androsyuk, I.G. Surmach, M.A. Pogoda, V.I. 2017-05-26T19:03:21Z 2017-05-26T19:03:21Z 2010 Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions / V.O. Lysiuk, N.L. Moskalenko, V.S. Staschuk, M.I. Kluy, O.V. Vakulenko, I.G. Androsyuk, M.A. Surmach, V.I. Pogoda // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 103-109. — Бібліогр.: 10 назв. — англ. 1560-8034 PACS 68.55.Ln, 85.60.Gz https://nasplib.isofts.kiev.ua/handle/123456789/117822 Bubble-like and crater-like blisters were observed at the boundaries of the
 structures “thin Ni film–lithium niobate” and “thin Pd film–lithium tantalate” implanted
 by Ar⁺
 ions. Analyses of these systems by AFM and SEM have shown that ion
 implantation essentially modifies near-surface structures with changing their optical,
 electrical and mechanical properties. Differences in the optical properties and surface
 structure between implanted and non-implanted systems are observed and explained by
 different properties of materials, widening interface “film–substrate” as well as by other
 known effects and phenomena. Enhanced adhesion of these films to substrate,
 nonselective spectral response is a base for effective and perspective application of the
 systems in development of high-sensitive pyroelectric detectors with a wide spectral
 range and high optical damage threshold. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions Article published earlier |
| spellingShingle | Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions Lysiuk, V.O. Moskalenko, N.L. Staschuk, V.S. Kluy, M.I. Vakulenko, O.V. Androsyuk, I.G. Surmach, M.A. Pogoda, V.I. |
| title | Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions |
| title_full | Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions |
| title_fullStr | Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions |
| title_full_unstemmed | Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions |
| title_short | Formation of blisters in thin metal films on lithium niobate implanted by keV Ar⁺ ions |
| title_sort | formation of blisters in thin metal films on lithium niobate implanted by kev ar⁺ ions |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/117822 |
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