Begun, E., Bratus’, O., Evtukh, A., Kaganovich, E., & Manoilov, E. (2007). Charge characteristics of the MOS structures with oxide films containing Si nanocrystals. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Begun, E.V, O.L Bratus’, A.A Evtukh, E.B Kaganovich, und E.G Manoilov. "Charge Characteristics of the MOS Structures with Oxide Films Containing Si Nanocrystals." Semiconductor Physics Quantum Electronics & Optoelectronics 2007.
MLA-Zitierstil (8. Ausg.)Begun, E.V, et al. "Charge Characteristics of the MOS Structures with Oxide Films Containing Si Nanocrystals." Semiconductor Physics Quantum Electronics & Optoelectronics, 2007.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.