APA (7th ed.) Citation

Begun, E., Bratus’, O., Evtukh, A., Kaganovich, E., & Manoilov, E. (2007). Charge characteristics of the MOS structures with oxide films containing Si nanocrystals. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Begun, E.V, O.L Bratus’, A.A Evtukh, E.B Kaganovich, and E.G Manoilov. "Charge Characteristics of the MOS Structures with Oxide Films Containing Si Nanocrystals." Semiconductor Physics Quantum Electronics & Optoelectronics 2007.

MLA (8th ed.) Citation

Begun, E.V, et al. "Charge Characteristics of the MOS Structures with Oxide Films Containing Si Nanocrystals." Semiconductor Physics Quantum Electronics & Optoelectronics, 2007.

Warning: These citations may not always be 100% accurate.