Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics

The optical properties of multilayer structures consisting of dielectric, conductivity-oxide and nanoscaled metal layers, deposited on the planar substrates (witness samples) and surface relief ones (diffraction gratings) with micro- and nanoscale sizes, are investigated by AFM, spectral ellipsom...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2007
Hauptverfasser: Dmitruk, N.L., Mayeva, O.I., Korovin, A.V., Mamykin, S.V., Sosnova, M.V., Yastrubchak, O.B.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2007
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/117917
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics / N.L. Dmitruk, O.I. Mayeva, A.V. Korovin, S.V. Mamykin, M.V. Sosnova, O.B. Yastrubchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 62-71. — Бібліогр.: 30 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-117917
record_format dspace
spelling Dmitruk, N.L.
Mayeva, O.I.
Korovin, A.V.
Mamykin, S.V.
Sosnova, M.V.
Yastrubchak, O.B.
2017-05-27T12:20:57Z
2017-05-27T12:20:57Z
2007
Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics / N.L. Dmitruk, O.I. Mayeva, A.V. Korovin, S.V. Mamykin, M.V. Sosnova, O.B. Yastrubchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 62-71. — Бібліогр.: 30 назв. — англ.
1560-8034
PACS 42.79.Dj, 71.36.+c,73.20.Mf
https://nasplib.isofts.kiev.ua/handle/123456789/117917
The optical properties of multilayer structures consisting of dielectric, conductivity-oxide and nanoscaled metal layers, deposited on the planar substrates (witness samples) and surface relief ones (diffraction gratings) with micro- and nanoscale sizes, are investigated by AFM, spectral ellipsometry (SE), and photometric techniques. The SE-measured parameters are related to actual characteristics of the layers when specified the model of their near-surface regions. Using a parametrization of the layer dielectric function versus the wavelength and a fitting procedure, the dielectric parameters are determined. It is shown that the optical constants are affected by both the substrate morphology and the adjacent medium. Preliminary data about the influence of isolated particle plasmon excitations in 2D-substrates with the top nanoscaled Au layer on its optical properties are presented.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics
spellingShingle Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics
Dmitruk, N.L.
Mayeva, O.I.
Korovin, A.V.
Mamykin, S.V.
Sosnova, M.V.
Yastrubchak, O.B.
title_short Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics
title_full Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics
title_fullStr Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics
title_full_unstemmed Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics
title_sort characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics
author Dmitruk, N.L.
Mayeva, O.I.
Korovin, A.V.
Mamykin, S.V.
Sosnova, M.V.
Yastrubchak, O.B.
author_facet Dmitruk, N.L.
Mayeva, O.I.
Korovin, A.V.
Mamykin, S.V.
Sosnova, M.V.
Yastrubchak, O.B.
publishDate 2007
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The optical properties of multilayer structures consisting of dielectric, conductivity-oxide and nanoscaled metal layers, deposited on the planar substrates (witness samples) and surface relief ones (diffraction gratings) with micro- and nanoscale sizes, are investigated by AFM, spectral ellipsometry (SE), and photometric techniques. The SE-measured parameters are related to actual characteristics of the layers when specified the model of their near-surface regions. Using a parametrization of the layer dielectric function versus the wavelength and a fitting procedure, the dielectric parameters are determined. It is shown that the optical constants are affected by both the substrate morphology and the adjacent medium. Preliminary data about the influence of isolated particle plasmon excitations in 2D-substrates with the top nanoscaled Au layer on its optical properties are presented.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/117917
citation_txt Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics / N.L. Dmitruk, O.I. Mayeva, A.V. Korovin, S.V. Mamykin, M.V. Sosnova, O.B. Yastrubchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 62-71. — Бібліогр.: 30 назв. — англ.
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AT korovinav characterizationofnanoscaledfilmsonflatandgratingsubstratesassomeelementsofplasmonics
AT mamykinsv characterizationofnanoscaledfilmsonflatandgratingsubstratesassomeelementsofplasmonics
AT sosnovamv characterizationofnanoscaledfilmsonflatandgratingsubstratesassomeelementsofplasmonics
AT yastrubchakob characterizationofnanoscaledfilmsonflatandgratingsubstratesassomeelementsofplasmonics
first_indexed 2025-12-01T11:26:28Z
last_indexed 2025-12-01T11:26:28Z
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