Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics
The optical properties of multilayer structures consisting of dielectric,
 conductivity-oxide and nanoscaled metal layers, deposited on the planar substrates
 (witness samples) and surface relief ones (diffraction gratings) with micro- and nanoscale
 sizes, are investigated b...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 2007 |
| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
| Published: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2007
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/117917 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics / N.L. Dmitruk, O.I. Mayeva, A.V. Korovin, S.V. Mamykin, M.V. Sosnova, O.B. Yastrubchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 62-71. — Бібліогр.: 30 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862646366912643072 |
|---|---|
| author | Dmitruk, N.L. Mayeva, O.I. Korovin, A.V. Mamykin, S.V. Sosnova, M.V. Yastrubchak, O.B. |
| author_facet | Dmitruk, N.L. Mayeva, O.I. Korovin, A.V. Mamykin, S.V. Sosnova, M.V. Yastrubchak, O.B. |
| citation_txt | Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics / N.L. Dmitruk, O.I. Mayeva, A.V. Korovin, S.V. Mamykin, M.V. Sosnova, O.B. Yastrubchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 62-71. — Бібліогр.: 30 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The optical properties of multilayer structures consisting of dielectric,
conductivity-oxide and nanoscaled metal layers, deposited on the planar substrates
(witness samples) and surface relief ones (diffraction gratings) with micro- and nanoscale
sizes, are investigated by AFM, spectral ellipsometry (SE), and photometric techniques.
The SE-measured parameters are related to actual characteristics of the layers when
specified the model of their near-surface regions. Using a parametrization of the layer
dielectric function versus the wavelength and a fitting procedure, the dielectric
parameters are determined. It is shown that the optical constants are affected by both the
substrate morphology and the adjacent medium. Preliminary data about the influence of
isolated particle plasmon excitations in 2D-substrates with the top nanoscaled Au layer
on its optical properties are presented.
|
| first_indexed | 2025-12-01T11:26:28Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-117917 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-01T11:26:28Z |
| publishDate | 2007 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Dmitruk, N.L. Mayeva, O.I. Korovin, A.V. Mamykin, S.V. Sosnova, M.V. Yastrubchak, O.B. 2017-05-27T12:20:57Z 2017-05-27T12:20:57Z 2007 Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics / N.L. Dmitruk, O.I. Mayeva, A.V. Korovin, S.V. Mamykin, M.V. Sosnova, O.B. Yastrubchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 62-71. — Бібліогр.: 30 назв. — англ. 1560-8034 PACS 42.79.Dj, 71.36.+c,73.20.Mf https://nasplib.isofts.kiev.ua/handle/123456789/117917 The optical properties of multilayer structures consisting of dielectric,
 conductivity-oxide and nanoscaled metal layers, deposited on the planar substrates
 (witness samples) and surface relief ones (diffraction gratings) with micro- and nanoscale
 sizes, are investigated by AFM, spectral ellipsometry (SE), and photometric techniques.
 The SE-measured parameters are related to actual characteristics of the layers when
 specified the model of their near-surface regions. Using a parametrization of the layer
 dielectric function versus the wavelength and a fitting procedure, the dielectric
 parameters are determined. It is shown that the optical constants are affected by both the
 substrate morphology and the adjacent medium. Preliminary data about the influence of
 isolated particle plasmon excitations in 2D-substrates with the top nanoscaled Au layer
 on its optical properties are presented. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics Article published earlier |
| spellingShingle | Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics Dmitruk, N.L. Mayeva, O.I. Korovin, A.V. Mamykin, S.V. Sosnova, M.V. Yastrubchak, O.B. |
| title | Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| title_full | Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| title_fullStr | Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| title_full_unstemmed | Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| title_short | Characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| title_sort | characterization of nanoscaled films on flat and grating substrates as some elements of plasmonics |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/117917 |
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