IR sensor readout devices with source input circuits

Silicon readout devices with input direct injection and buffered direct injection circuits and charge-coupled devices (CCD) multiplexers to be used with n⁺-p- or p⁺-n-photovoltaic (PV) multielement arrays were designed, manufactured and tested in T = 77…300 K temperature region. The on-chip testing...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:1999
Hauptverfasser: Sizov, F.F., Reva, V.P., Derkach, Yu.P., Kononenko, Yu.G., Golenkov, A.G., Korinets, S.V., Darchuk, S.D., Filenko, D.A.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1999
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/117929
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:IR sensor readout devices with source input circuits / F.F. Sizov, V.P. Reva, Yu.P. Derkach, Yu.G. Kononenko, A.G. Golenkov, S.V. Korinets, S.D. Darchuk, D.A. Filenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 102-110. — Бібліогр.: 17 назв. — англ.

Institution

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-117929
record_format dspace
spelling Sizov, F.F.
Reva, V.P.
Derkach, Yu.P.
Kononenko, Yu.G.
Golenkov, A.G.
Korinets, S.V.
Darchuk, S.D.
Filenko, D.A.
2017-05-27T16:08:34Z
2017-05-27T16:08:34Z
1999
IR sensor readout devices with source input circuits / F.F. Sizov, V.P. Reva, Yu.P. Derkach, Yu.G. Kononenko, A.G. Golenkov, S.V. Korinets, S.D. Darchuk, D.A. Filenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 102-110. — Бібліогр.: 17 назв. — англ.
1560-8034
PACS 07.07.D, 42.79.P,Q; 85.30
https://nasplib.isofts.kiev.ua/handle/123456789/117929
Silicon readout devices with input direct injection and buffered direct injection circuits and charge-coupled devices (CCD) multiplexers to be used with n⁺-p- or p⁺-n-photovoltaic (PV) multielement arrays were designed, manufactured and tested in T = 77…300 K temperature region. The on-chip testing switches attach the sources of direct injection transistors to the common load resistors to imitate the output signal of mercury cadmium telluride (MCT) photodiodes. The silicon readout devices for 2x64 n⁺-p- or p⁺-n - linear arrays and n⁺-p- 2x4x128(144) time-delay and integration (TDI) arrays with skimming and partitioning functions were manufactured by n- or p-channel MOS technology with buried channel CCD registers. The designed CCD readout devices are driven with four- or two-phase clocking pulses.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
IR sensor readout devices with source input circuits
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title IR sensor readout devices with source input circuits
spellingShingle IR sensor readout devices with source input circuits
Sizov, F.F.
Reva, V.P.
Derkach, Yu.P.
Kononenko, Yu.G.
Golenkov, A.G.
Korinets, S.V.
Darchuk, S.D.
Filenko, D.A.
title_short IR sensor readout devices with source input circuits
title_full IR sensor readout devices with source input circuits
title_fullStr IR sensor readout devices with source input circuits
title_full_unstemmed IR sensor readout devices with source input circuits
title_sort ir sensor readout devices with source input circuits
author Sizov, F.F.
Reva, V.P.
Derkach, Yu.P.
Kononenko, Yu.G.
Golenkov, A.G.
Korinets, S.V.
Darchuk, S.D.
Filenko, D.A.
author_facet Sizov, F.F.
Reva, V.P.
Derkach, Yu.P.
Kononenko, Yu.G.
Golenkov, A.G.
Korinets, S.V.
Darchuk, S.D.
Filenko, D.A.
publishDate 1999
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Silicon readout devices with input direct injection and buffered direct injection circuits and charge-coupled devices (CCD) multiplexers to be used with n⁺-p- or p⁺-n-photovoltaic (PV) multielement arrays were designed, manufactured and tested in T = 77…300 K temperature region. The on-chip testing switches attach the sources of direct injection transistors to the common load resistors to imitate the output signal of mercury cadmium telluride (MCT) photodiodes. The silicon readout devices for 2x64 n⁺-p- or p⁺-n - linear arrays and n⁺-p- 2x4x128(144) time-delay and integration (TDI) arrays with skimming and partitioning functions were manufactured by n- or p-channel MOS technology with buried channel CCD registers. The designed CCD readout devices are driven with four- or two-phase clocking pulses.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/117929
citation_txt IR sensor readout devices with source input circuits / F.F. Sizov, V.P. Reva, Yu.P. Derkach, Yu.G. Kononenko, A.G. Golenkov, S.V. Korinets, S.D. Darchuk, D.A. Filenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 102-110. — Бібліогр.: 17 назв. — англ.
work_keys_str_mv AT sizovff irsensorreadoutdeviceswithsourceinputcircuits
AT revavp irsensorreadoutdeviceswithsourceinputcircuits
AT derkachyup irsensorreadoutdeviceswithsourceinputcircuits
AT kononenkoyug irsensorreadoutdeviceswithsourceinputcircuits
AT golenkovag irsensorreadoutdeviceswithsourceinputcircuits
AT korinetssv irsensorreadoutdeviceswithsourceinputcircuits
AT darchuksd irsensorreadoutdeviceswithsourceinputcircuits
AT filenkoda irsensorreadoutdeviceswithsourceinputcircuits
first_indexed 2025-12-01T15:49:14Z
last_indexed 2025-12-01T15:49:14Z
_version_ 1850860634863828992