Electro-physical properties of γ-exposed crystals of silicon and germanium

The paper represents a review of research data upon changing electrophysical properties of n-Si and n-Ge when radiation defects arise under action of different γ-irradiation doses. Analyzed are consequences of arising deep levels of radiation defects in the forbidden band of silicon and germanium, w...

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Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:1999
Автор: Dotsenko, Yu. P.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1999
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/117933
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Electro-physical properties of γ-exposed crystals of silicon and germanium / Yu.P. Dotsenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 47-55. — Бібліогр.: 63 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-117933
record_format dspace
spelling Dotsenko, Yu. P.
2017-05-27T16:18:04Z
2017-05-27T16:18:04Z
1999
Electro-physical properties of γ-exposed crystals of silicon and germanium / Yu.P. Dotsenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 47-55. — Бібліогр.: 63 назв. — англ.
1560-8034
PACS 72.15.E, 72.20, 61.72.T, 72.80.C., 71.55.A
https://nasplib.isofts.kiev.ua/handle/123456789/117933
The paper represents a review of research data upon changing electrophysical properties of n-Si and n-Ge when radiation defects arise under action of different γ-irradiation doses. Analyzed are consequences of arising deep levels of radiation defects in the forbidden band of silicon and germanium, which leads to the considerable increase of resistivity gradients caused by non-uniform compensation of shallow donor centers. In addition, considered are characteristics of radiation defects energy levels which determine both regularities of electrophysical properties changes and peculiarities of tensoeffects in γ-irradiated crystals. It is noticed that neutron-doped n-Si (P) has larger radiation hardness in respect to γ-irradiation as sompared to silicon doped with phosphorus in the course of crystal growth.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Electro-physical properties of γ-exposed crystals of silicon and germanium
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Electro-physical properties of γ-exposed crystals of silicon and germanium
spellingShingle Electro-physical properties of γ-exposed crystals of silicon and germanium
Dotsenko, Yu. P.
title_short Electro-physical properties of γ-exposed crystals of silicon and germanium
title_full Electro-physical properties of γ-exposed crystals of silicon and germanium
title_fullStr Electro-physical properties of γ-exposed crystals of silicon and germanium
title_full_unstemmed Electro-physical properties of γ-exposed crystals of silicon and germanium
title_sort electro-physical properties of γ-exposed crystals of silicon and germanium
author Dotsenko, Yu. P.
author_facet Dotsenko, Yu. P.
publishDate 1999
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The paper represents a review of research data upon changing electrophysical properties of n-Si and n-Ge when radiation defects arise under action of different γ-irradiation doses. Analyzed are consequences of arising deep levels of radiation defects in the forbidden band of silicon and germanium, which leads to the considerable increase of resistivity gradients caused by non-uniform compensation of shallow donor centers. In addition, considered are characteristics of radiation defects energy levels which determine both regularities of electrophysical properties changes and peculiarities of tensoeffects in γ-irradiated crystals. It is noticed that neutron-doped n-Si (P) has larger radiation hardness in respect to γ-irradiation as sompared to silicon doped with phosphorus in the course of crystal growth.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/117933
citation_txt Electro-physical properties of γ-exposed crystals of silicon and germanium / Yu.P. Dotsenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 47-55. — Бібліогр.: 63 назв. — англ.
work_keys_str_mv AT dotsenkoyup electrophysicalpropertiesofγexposedcrystalsofsiliconandgermanium
first_indexed 2025-12-07T19:38:24Z
last_indexed 2025-12-07T19:38:24Z
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