Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals

Hall effect, resistivity and p-n-junction characteristics were investigated on high pure and perfect p-type Hg₁₋xCdxTe crystals (x ~ 0.2) versus temperature, doping, and a way of heat treatment. It was shown, that activation energy of extrinsic acceptors does not depend on conditions of the crystal...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:1999
Main Author: Bogoboyashchiy, V.V.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1999
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/117935
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals / V.V. Bogoboyashchiy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 62-69. — Бібліогр.: 14 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Bogoboyashchiy, V.V.
author_facet Bogoboyashchiy, V.V.
citation_txt Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals / V.V. Bogoboyashchiy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 62-69. — Бібліогр.: 14 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Hall effect, resistivity and p-n-junction characteristics were investigated on high pure and perfect p-type Hg₁₋xCdxTe crystals (x ~ 0.2) versus temperature, doping, and a way of heat treatment. It was shown, that activation energy of extrinsic acceptors does not depend on conditions of the crystal heat treatment, while the first native acceptor level increases monotonically from 10 meV in the Hg-saturated crystal up to 15.4 meV in the Te-saturated one. The experimentally observed energy of the first level of the native acceptor in Te-saturated crystals (15.4 meV) is in a good agreement with the value 16 meV, obtained by calculation carried out in the framework of the effective mass approximation. The difference between the crystals, saturated by Hg or Te, has an essential effect for reverse dark current through a p-n-junction at T = 77 K. It should be taken into account when manufacturing the photodiodes.
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institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-02T07:30:39Z
publishDate 1999
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Bogoboyashchiy, V.V.
2017-05-27T16:25:22Z
2017-05-27T16:25:22Z
1999
Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals / V.V. Bogoboyashchiy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 62-69. — Бібліогр.: 14 назв. — англ.
1560-8034
PACS 72.20.M, 73.40
https://nasplib.isofts.kiev.ua/handle/123456789/117935
Hall effect, resistivity and p-n-junction characteristics were investigated on high pure and perfect p-type Hg₁₋xCdxTe crystals (x ~ 0.2) versus temperature, doping, and a way of heat treatment. It was shown, that activation energy of extrinsic acceptors does not depend on conditions of the crystal heat treatment, while the first native acceptor level increases monotonically from 10 meV in the Hg-saturated crystal up to 15.4 meV in the Te-saturated one. The experimentally observed energy of the first level of the native acceptor in Te-saturated crystals (15.4 meV) is in a good agreement with the value 16 meV, obtained by calculation carried out in the framework of the effective mass approximation. The difference between the crystals, saturated by Hg or Te, has an essential effect for reverse dark current through a p-n-junction at T = 77 K. It should be taken into account when manufacturing the photodiodes.
In summary the author would like to thank K.R.Kurbanov for crystal growth and express his sincere gratitude to A. I. Yelizarov, V. V. Kruzhaiev, and G. V. Minkov for submitting data about influence of the light holes on the field dependence of the Hall effect at low temperatures T < 77 K.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals
Article
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spellingShingle Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals
Bogoboyashchiy, V.V.
title Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals
title_full Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals
title_fullStr Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals
title_full_unstemmed Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals
title_short Effect of annealing on activation of native acceptors in narrow-gap p-HgCdTe crystals
title_sort effect of annealing on activation of native acceptors in narrow-gap p-hgcdte crystals
url https://nasplib.isofts.kiev.ua/handle/123456789/117935
work_keys_str_mv AT bogoboyashchiyvv effectofannealingonactivationofnativeacceptorsinnarrowgapphgcdtecrystals