Balovsyak, S., Fodchuk, I., & Lytvyn, P. (2003). Determination of surface parameters of solids by methods of X-ray total external reflection. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Balovsyak, S.V, I.M Fodchuk, und P.M Lytvyn. "Determination of Surface Parameters of Solids by Methods of X-ray Total External Reflection." Semiconductor Physics Quantum Electronics & Optoelectronics 2003.
MLA-Zitierstil (8. Ausg.)Balovsyak, S.V, et al. "Determination of Surface Parameters of Solids by Methods of X-ray Total External Reflection." Semiconductor Physics Quantum Electronics & Optoelectronics, 2003.
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