Balovsyak, S., Fodchuk, I., & Lytvyn, P. (2003). Determination of surface parameters of solids by methods of X-ray total external reflection. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago Style (17th ed.) CitationBalovsyak, S.V, I.M Fodchuk, and P.M Lytvyn. "Determination of Surface Parameters of Solids by Methods of X-ray Total External Reflection." Semiconductor Physics Quantum Electronics & Optoelectronics 2003.
MLA (8th ed.) CitationBalovsyak, S.V, et al. "Determination of Surface Parameters of Solids by Methods of X-ray Total External Reflection." Semiconductor Physics Quantum Electronics & Optoelectronics, 2003.
Warning: These citations may not always be 100% accurate.