Belyaeva, A., Galuza, A., & Kudlenko, A. (2003). Origin of surface layer on common substrates for functional material films probed by ellipsometry. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Belyaeva, A.I, A.A Galuza, und A.D Kudlenko. "Origin of Surface Layer on Common Substrates for Functional Material Films Probed by Ellipsometry." Semiconductor Physics Quantum Electronics & Optoelectronics 2003.
MLA-Zitierstil (8. Ausg.)Belyaeva, A.I, et al. "Origin of Surface Layer on Common Substrates for Functional Material Films Probed by Ellipsometry." Semiconductor Physics Quantum Electronics & Optoelectronics, 2003.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.