On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes

We investigated a current flow mechanism in the Au−TiBx−n-GaN−i-Al₂O₃
 Schottky barrier diodes, in which the space-charge region width is much over the de
 Broglie wavelength in GaN. An analysis of the temperature dependences of the I−V
 curves of forward-biased Schottky barr...

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Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2007
Автори: Belyaev, A.E., Boltovets, N.S., Ivanov, V.N., Klad’ko, V.P., Konakova, R.V., Kudryk, Ya.Ya., Kuchuk, A.V., Milenin, V.V., Sveshnikov, Yu.N., Sheremet, V.N.
Формат: Стаття
Мова:Англійська
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2007
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/117993
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes / A.E. Belyaev, N.S. Boltovets, V.N. Ivanov, V.P. Klad'ko, R.V. Konakova, Ya.Ya. Kudruk, A.V. Kuchuk, V.V. Milenin, Yu.N. Sveshnikov, V.N. Sheremet // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 3. — С. 1-5. — Бібліогр.: 13 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
_version_ 1862695464118255616
author Belyaev, A.E.
Boltovets, N.S.
Ivanov, V.N.
Klad’ko, V.P.
Konakova, R.V.
Kudryk, Ya.Ya.
Kuchuk, A.V.
Milenin, V.V.
Sveshnikov, Yu.N.
Sheremet, V.N.
author_facet Belyaev, A.E.
Boltovets, N.S.
Ivanov, V.N.
Klad’ko, V.P.
Konakova, R.V.
Kudryk, Ya.Ya.
Kuchuk, A.V.
Milenin, V.V.
Sveshnikov, Yu.N.
Sheremet, V.N.
citation_txt On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes / A.E. Belyaev, N.S. Boltovets, V.N. Ivanov, V.P. Klad'ko, R.V. Konakova, Ya.Ya. Kudruk, A.V. Kuchuk, V.V. Milenin, Yu.N. Sveshnikov, V.N. Sheremet // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 3. — С. 1-5. — Бібліогр.: 13 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description We investigated a current flow mechanism in the Au−TiBx−n-GaN−i-Al₂O₃
 Schottky barrier diodes, in which the space-charge region width is much over the de
 Broglie wavelength in GaN. An analysis of the temperature dependences of the I−V
 curves of forward-biased Schottky barriers showed that, in the temperature range
 80−380 K, the current flow occurs as a tunneling one along dislocations crossing the
 space-charge region. The dislocation density ρ estimated from the I−V curves (in
 accordance with the model of tunneling along the dislocation line) was ≈ 1.7×10⁷ cm⁻².
 This value is close to that obtained with x-ray diffraction technique
first_indexed 2025-12-07T16:24:32Z
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institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
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language English
last_indexed 2025-12-07T16:24:32Z
publishDate 2007
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Belyaev, A.E.
Boltovets, N.S.
Ivanov, V.N.
Klad’ko, V.P.
Konakova, R.V.
Kudryk, Ya.Ya.
Kuchuk, A.V.
Milenin, V.V.
Sveshnikov, Yu.N.
Sheremet, V.N.
2017-05-27T20:09:23Z
2017-05-27T20:09:23Z
2007
On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes / A.E. Belyaev, N.S. Boltovets, V.N. Ivanov, V.P. Klad'ko, R.V. Konakova, Ya.Ya. Kudruk, A.V. Kuchuk, V.V. Milenin, Yu.N. Sveshnikov, V.N. Sheremet // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 3. — С. 1-5. — Бібліогр.: 13 назв. — англ.
1560-8034
PACS 61.72.Lk, 61.72.Vv, 73.40.Gk, 85.30.Kk
https://nasplib.isofts.kiev.ua/handle/123456789/117993
We investigated a current flow mechanism in the Au−TiBx−n-GaN−i-Al₂O₃
 Schottky barrier diodes, in which the space-charge region width is much over the de
 Broglie wavelength in GaN. An analysis of the temperature dependences of the I−V
 curves of forward-biased Schottky barriers showed that, in the temperature range
 80−380 K, the current flow occurs as a tunneling one along dislocations crossing the
 space-charge region. The dislocation density ρ estimated from the I−V curves (in
 accordance with the model of tunneling along the dislocation line) was ≈ 1.7×10⁷ cm⁻².
 This value is close to that obtained with x-ray diffraction technique
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes
Article
published earlier
spellingShingle On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes
Belyaev, A.E.
Boltovets, N.S.
Ivanov, V.N.
Klad’ko, V.P.
Konakova, R.V.
Kudryk, Ya.Ya.
Kuchuk, A.V.
Milenin, V.V.
Sveshnikov, Yu.N.
Sheremet, V.N.
title On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes
title_full On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes
title_fullStr On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes
title_full_unstemmed On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes
title_short On the current flow mechanism in the Au-TiBx-n-GaN-i-Al₂O₃ Schottky barrier diodes
title_sort on the current flow mechanism in the au-tibx-n-gan-i-al₂o₃ schottky barrier diodes
url https://nasplib.isofts.kiev.ua/handle/123456789/117993
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