Avalanche multiplication of charge carriers in nanostructured porous silicon

The phenomenon of avalanche multiplication of charge carriers in Al/PS-(c-Si) sandwich-structures based on nanostructured porous silicon (PS) is studied. Experimentally received dependences of ionization rates on intensity of an electrical field correspond to the diffusion mechanism of electron-hole...

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Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2003
Автори: Timokhov, D.F., Timokhov, F.P.
Формат: Стаття
Мова:Англійська
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/118035
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Avalanche multiplication of charge carriers in nanostructured porous silicon / D.F. Timokhov, F.P. Timokhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 307-310. — Бібліогр.: 14 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Timokhov, D.F.
Timokhov, F.P.
author_facet Timokhov, D.F.
Timokhov, F.P.
citation_txt Avalanche multiplication of charge carriers in nanostructured porous silicon / D.F. Timokhov, F.P. Timokhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 307-310. — Бібліогр.: 14 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description The phenomenon of avalanche multiplication of charge carriers in Al/PS-(c-Si) sandwich-structures based on nanostructured porous silicon (PS) is studied. Experimentally received dependences of ionization rates on intensity of an electrical field correspond to the diffusion mechanism of electron-hole pairs heating up to a threshold of ionization. The distinction of effective factors of shock ionization for electrons and holes is unsignificant. The estimation of length of free run of hot electrons is carried out at scattering of energy on the optical phonons.
first_indexed 2025-11-28T15:46:59Z
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language English
last_indexed 2025-11-28T15:46:59Z
publishDate 2003
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Timokhov, D.F.
Timokhov, F.P.
2017-05-28T09:05:47Z
2017-05-28T09:05:47Z
2003
Avalanche multiplication of charge carriers in nanostructured porous silicon / D.F. Timokhov, F.P. Timokhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 307-310. — Бібліогр.: 14 назв. — англ.
1560-8034
PACS: 72.80.Cw; 72.80.Ng; 72.40.+w; 73.40.Gk
https://nasplib.isofts.kiev.ua/handle/123456789/118035
The phenomenon of avalanche multiplication of charge carriers in Al/PS-(c-Si) sandwich-structures based on nanostructured porous silicon (PS) is studied. Experimentally received dependences of ionization rates on intensity of an electrical field correspond to the diffusion mechanism of electron-hole pairs heating up to a threshold of ionization. The distinction of effective factors of shock ionization for electrons and holes is unsignificant. The estimation of length of free run of hot electrons is carried out at scattering of energy on the optical phonons.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Avalanche multiplication of charge carriers in nanostructured porous silicon
Article
published earlier
spellingShingle Avalanche multiplication of charge carriers in nanostructured porous silicon
Timokhov, D.F.
Timokhov, F.P.
title Avalanche multiplication of charge carriers in nanostructured porous silicon
title_full Avalanche multiplication of charge carriers in nanostructured porous silicon
title_fullStr Avalanche multiplication of charge carriers in nanostructured porous silicon
title_full_unstemmed Avalanche multiplication of charge carriers in nanostructured porous silicon
title_short Avalanche multiplication of charge carriers in nanostructured porous silicon
title_sort avalanche multiplication of charge carriers in nanostructured porous silicon
url https://nasplib.isofts.kiev.ua/handle/123456789/118035
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AT timokhovfp avalanchemultiplicationofchargecarriersinnanostructuredporoussilicon