Avalanche multiplication of charge carriers in nanostructured porous silicon

The phenomenon of avalanche multiplication of charge carriers in Al/PS-(c-Si) sandwich-structures based on nanostructured porous silicon (PS) is studied. Experimentally received dependences of ionization rates on intensity of an electrical field correspond to the diffusion mechanism of electron-hole...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2003
Main Authors: Timokhov, D.F., Timokhov, F.P.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/118035
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Avalanche multiplication of charge carriers in nanostructured porous silicon / D.F. Timokhov, F.P. Timokhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 307-310. — Бібліогр.: 14 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118035
record_format dspace
spelling Timokhov, D.F.
Timokhov, F.P.
2017-05-28T09:05:47Z
2017-05-28T09:05:47Z
2003
Avalanche multiplication of charge carriers in nanostructured porous silicon / D.F. Timokhov, F.P. Timokhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 307-310. — Бібліогр.: 14 назв. — англ.
1560-8034
PACS: 72.80.Cw; 72.80.Ng; 72.40.+w; 73.40.Gk
https://nasplib.isofts.kiev.ua/handle/123456789/118035
The phenomenon of avalanche multiplication of charge carriers in Al/PS-(c-Si) sandwich-structures based on nanostructured porous silicon (PS) is studied. Experimentally received dependences of ionization rates on intensity of an electrical field correspond to the diffusion mechanism of electron-hole pairs heating up to a threshold of ionization. The distinction of effective factors of shock ionization for electrons and holes is unsignificant. The estimation of length of free run of hot electrons is carried out at scattering of energy on the optical phonons.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Avalanche multiplication of charge carriers in nanostructured porous silicon
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Avalanche multiplication of charge carriers in nanostructured porous silicon
spellingShingle Avalanche multiplication of charge carriers in nanostructured porous silicon
Timokhov, D.F.
Timokhov, F.P.
title_short Avalanche multiplication of charge carriers in nanostructured porous silicon
title_full Avalanche multiplication of charge carriers in nanostructured porous silicon
title_fullStr Avalanche multiplication of charge carriers in nanostructured porous silicon
title_full_unstemmed Avalanche multiplication of charge carriers in nanostructured porous silicon
title_sort avalanche multiplication of charge carriers in nanostructured porous silicon
author Timokhov, D.F.
Timokhov, F.P.
author_facet Timokhov, D.F.
Timokhov, F.P.
publishDate 2003
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The phenomenon of avalanche multiplication of charge carriers in Al/PS-(c-Si) sandwich-structures based on nanostructured porous silicon (PS) is studied. Experimentally received dependences of ionization rates on intensity of an electrical field correspond to the diffusion mechanism of electron-hole pairs heating up to a threshold of ionization. The distinction of effective factors of shock ionization for electrons and holes is unsignificant. The estimation of length of free run of hot electrons is carried out at scattering of energy on the optical phonons.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118035
citation_txt Avalanche multiplication of charge carriers in nanostructured porous silicon / D.F. Timokhov, F.P. Timokhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 307-310. — Бібліогр.: 14 назв. — англ.
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first_indexed 2025-11-28T15:46:59Z
last_indexed 2025-11-28T15:46:59Z
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