APA (7th ed.) Citation

Dmitruk, N., Fursenko, O., Kondratenko, O., & Romanyuk, V. (2003). Optical characterization of thin Au films by standard and polaritonic ellipsometry. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Dmitruk, N.L, O.V Fursenko, O.S Kondratenko, and V.R Romanyuk. "Optical Characterization of Thin Au Films by Standard and Polaritonic Ellipsometry." Semiconductor Physics Quantum Electronics & Optoelectronics 2003.

MLA (8th ed.) Citation

Dmitruk, N.L, et al. "Optical Characterization of Thin Au Films by Standard and Polaritonic Ellipsometry." Semiconductor Physics Quantum Electronics & Optoelectronics, 2003.

Warning: These citations may not always be 100% accurate.