Optical characterization of thin Au films by standard and polaritonic ellipsometry
This work is aimed at optical characterization of thin Au films by multiple-angle-of-incidence reflectance ellipsometry at the fixed wavelength (632.8 nm) in standard and attenuated total reflection (ATR) modes in contact with different dielectric media (water, alcohol and air). The comparative expe...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 2003 |
| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2003
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/118041 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Optical characterization of thin Au films by standard and polaritonic ellipsometry / N.L. Dmitruk, O.V. Fursenko, O.S. Kondratenko, V.R. Romanyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 349-353. — Бібліогр.: 11 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862745304925732864 |
|---|---|
| author | Dmitruk, N.L. Fursenko, O.V. Kondratenko, O.S. Romanyuk, V.R. |
| author_facet | Dmitruk, N.L. Fursenko, O.V. Kondratenko, O.S. Romanyuk, V.R. |
| citation_txt | Optical characterization of thin Au films by standard and polaritonic ellipsometry / N.L. Dmitruk, O.V. Fursenko, O.S. Kondratenko, V.R. Romanyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 349-353. — Бібліогр.: 11 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | This work is aimed at optical characterization of thin Au films by multiple-angle-of-incidence reflectance ellipsometry at the fixed wavelength (632.8 nm) in standard and attenuated total reflection (ATR) modes in contact with different dielectric media (water, alcohol and air). The comparative experimental evaluation of the precision of determined optical parameters (refractive index n and absorption coefficient k) and thickness for both ellipsometric modes has been studied by calculation of their sensitivity correlation coefficients. Medium- and mode-related optical constants of Au films were revealed. In the ATR mode the effective optical parameters were higher then in the standard mode, n decreased and k increased with increasing the refractive index of adjoining medium. This effect must be taken into consideration in polaritonic optoelectronic and optochemical sensor technique.
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| first_indexed | 2025-12-07T20:39:44Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-118041 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T20:39:44Z |
| publishDate | 2003 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Dmitruk, N.L. Fursenko, O.V. Kondratenko, O.S. Romanyuk, V.R. 2017-05-28T09:40:00Z 2017-05-28T09:40:00Z 2003 Optical characterization of thin Au films by standard and polaritonic ellipsometry / N.L. Dmitruk, O.V. Fursenko, O.S. Kondratenko, V.R. Romanyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 349-353. — Бібліогр.: 11 назв. — англ. 1560-8034 PACS: 78.66.Bz, 78.66.-w https://nasplib.isofts.kiev.ua/handle/123456789/118041 This work is aimed at optical characterization of thin Au films by multiple-angle-of-incidence reflectance ellipsometry at the fixed wavelength (632.8 nm) in standard and attenuated total reflection (ATR) modes in contact with different dielectric media (water, alcohol and air). The comparative experimental evaluation of the precision of determined optical parameters (refractive index n and absorption coefficient k) and thickness for both ellipsometric modes has been studied by calculation of their sensitivity correlation coefficients. Medium- and mode-related optical constants of Au films were revealed. In the ATR mode the effective optical parameters were higher then in the standard mode, n decreased and k increased with increasing the refractive index of adjoining medium. This effect must be taken into consideration in polaritonic optoelectronic and optochemical sensor technique. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Optical characterization of thin Au films by standard and polaritonic ellipsometry Article published earlier |
| spellingShingle | Optical characterization of thin Au films by standard and polaritonic ellipsometry Dmitruk, N.L. Fursenko, O.V. Kondratenko, O.S. Romanyuk, V.R. |
| title | Optical characterization of thin Au films by standard and polaritonic ellipsometry |
| title_full | Optical characterization of thin Au films by standard and polaritonic ellipsometry |
| title_fullStr | Optical characterization of thin Au films by standard and polaritonic ellipsometry |
| title_full_unstemmed | Optical characterization of thin Au films by standard and polaritonic ellipsometry |
| title_short | Optical characterization of thin Au films by standard and polaritonic ellipsometry |
| title_sort | optical characterization of thin au films by standard and polaritonic ellipsometry |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/118041 |
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