Optical characterization of thin Au films by standard and polaritonic ellipsometry

• Published in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Date: 2003
• ISSN: 1560-8034
• Main Authors: Dmitruk, N.L., Fursenko, O.V., Kondratenko, O.S., Romanyuk, V.R.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/118041
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Optical characterization of thin Au films by standard and polaritonic ellipsometry / N.L. Dmitruk, O.V. Fursenko, O.S. Kondratenko, V.R. Romanyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 349-353. — Бібліогр.: 11 назв. — англ.

This work is aimed at optical characterization of thin Au films by multiple-angle-of-incidence reflectance ellipsometry at the fixed wavelength (632.8 nm) in standard and attenuated total reflection (ATR) modes in contact with different dielectric media (water, alcohol and air). The comparative expe...