Investigation of superlattice structure parameters using quasi-forbidden reflections

Investigation of superlattice structure parameters using quasi-forbidden reflections

We studied possibilities of a nondestructive X-ray technique for testing short-period strained GaAs-AlAs superlattices. An analysis of the quasi-forbidden 200 reflections may be used for determination of superlattice layer structure parameters and sublayer thickness. The effect of irregularity of su...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2003
Hauptverfasser: Kladko, V.P., Datsenko, L.I., Korchovyi, A.A., Machulin, V.F., Lytvyn, P.M., Shalimov, A.V., Kuchuk, A.V., Kogutyuk, P.P.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118048
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Investigation of superlattice structure parameters using quasi-forbidden reflections / V.P. Kladko, L.I. Datsenko, A.A. Korchovyi, V.F. Machulin, P.M. Lytvyn, A.V. Shalimov, A.V. Kuchuk, P.P. Kogutyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 392-396. — Бібліогр.: 7 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118048
record_format dspace
spelling Kladko, V.P.
Datsenko, L.I.
Korchovyi, A.A.
Machulin, V.F.
Lytvyn, P.M.
Shalimov, A.V.
Kuchuk, A.V.
Kogutyuk, P.P.
2017-05-28T14:28:06Z
2017-05-28T14:28:06Z
2003
Investigation of superlattice structure parameters using quasi-forbidden reflections / V.P. Kladko, L.I. Datsenko, A.A. Korchovyi, V.F. Machulin, P.M. Lytvyn, A.V. Shalimov, A.V. Kuchuk, P.P. Kogutyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 392-396. — Бібліогр.: 7 назв. — англ.
1560-8034
PACS: 68.65.Cd
https://nasplib.isofts.kiev.ua/handle/123456789/118048
We studied possibilities of a nondestructive X-ray technique for testing short-period strained GaAs-AlAs superlattices. An analysis of the quasi-forbidden 200 reflections may be used for determination of superlattice layer structure parameters and sublayer thickness. The effect of irregularity of superlattice transition region on X-ray diffraction reflection curves and elastic strains in layers was studied.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Investigation of superlattice structure parameters using quasi-forbidden reflections
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Investigation of superlattice structure parameters using quasi-forbidden reflections
spellingShingle Investigation of superlattice structure parameters using quasi-forbidden reflections
Kladko, V.P.
Datsenko, L.I.
Korchovyi, A.A.
Machulin, V.F.
Lytvyn, P.M.
Shalimov, A.V.
Kuchuk, A.V.
Kogutyuk, P.P.
title_short Investigation of superlattice structure parameters using quasi-forbidden reflections
title_full Investigation of superlattice structure parameters using quasi-forbidden reflections
title_fullStr Investigation of superlattice structure parameters using quasi-forbidden reflections
title_full_unstemmed Investigation of superlattice structure parameters using quasi-forbidden reflections
title_sort investigation of superlattice structure parameters using quasi-forbidden reflections
author Kladko, V.P.
Datsenko, L.I.
Korchovyi, A.A.
Machulin, V.F.
Lytvyn, P.M.
Shalimov, A.V.
Kuchuk, A.V.
Kogutyuk, P.P.
author_facet Kladko, V.P.
Datsenko, L.I.
Korchovyi, A.A.
Machulin, V.F.
Lytvyn, P.M.
Shalimov, A.V.
Kuchuk, A.V.
Kogutyuk, P.P.
publishDate 2003
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description We studied possibilities of a nondestructive X-ray technique for testing short-period strained GaAs-AlAs superlattices. An analysis of the quasi-forbidden 200 reflections may be used for determination of superlattice layer structure parameters and sublayer thickness. The effect of irregularity of superlattice transition region on X-ray diffraction reflection curves and elastic strains in layers was studied.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118048
citation_txt Investigation of superlattice structure parameters using quasi-forbidden reflections / V.P. Kladko, L.I. Datsenko, A.A. Korchovyi, V.F. Machulin, P.M. Lytvyn, A.V. Shalimov, A.V. Kuchuk, P.P. Kogutyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 392-396. — Бібліогр.: 7 назв. — англ.
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AT datsenkoli investigationofsuperlatticestructureparametersusingquasiforbiddenreflections
AT korchovyiaa investigationofsuperlatticestructureparametersusingquasiforbiddenreflections
AT machulinvf investigationofsuperlatticestructureparametersusingquasiforbiddenreflections
AT lytvynpm investigationofsuperlatticestructureparametersusingquasiforbiddenreflections
AT shalimovav investigationofsuperlatticestructureparametersusingquasiforbiddenreflections
AT kuchukav investigationofsuperlatticestructureparametersusingquasiforbiddenreflections
AT kogutyukpp investigationofsuperlatticestructureparametersusingquasiforbiddenreflections
first_indexed 2025-12-07T13:35:41Z
last_indexed 2025-12-07T13:35:41Z
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