Singular optics methods for analysis of spatial structure of diffraction field of optical elements
The paper is devoted to developing methods of analytical and experimental investigations of diffraction and interference phenomena used in test systems for optical elements. The theoretical analysis and experimental results illustrate the possibility of describing diffraction phenomena using the obj...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 2003 |
| Main Authors: | , |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2003
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/118054 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Singular optics methods for analysis of spatial structure of diffraction field of optical elements / O.P. Budnyk, R.A. Lymarenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 417-422. — Бібліогр.: 13 назв. — англ. |
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Budnyk, O.P. Lymarenko, R.A. 2017-05-28T14:39:01Z 2017-05-28T14:39:01Z 2003 Singular optics methods for analysis of spatial structure of diffraction field of optical elements / O.P. Budnyk, R.A. Lymarenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 417-422. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS: 42.15.F, 42.25.F https://nasplib.isofts.kiev.ua/handle/123456789/118054 The paper is devoted to developing methods of analytical and experimental investigations of diffraction and interference phenomena used in test systems for optical elements. The theoretical analysis and experimental results illustrate the possibility of describing diffraction phenomena using the objects and methods that were developed in singular optics. It was shown that a system of dislocations in singular component of diffraction field represents its topology. The diffracted field has a system of hidden optical vortices that are smoothly transformed during deformation of an aperture depending on boundary flexion. The proposed experimental proof ground can be useful for the analysis of a wavefront structure. It is also considered the technique for more accurate evaluation of Ronchi test results. The mathematical background of the Ronchi test technique is developed. It describes sufficiently well the wavefront shape, grating plate parameters, image sensor characteristics, parameters of image acquisition and restoration. The fringe pattern distributions and their spatial spectrum are calculated. Both the results of computer simulation of Ronchi fringe pattern and experimental ones obtained using image sensor and the applied image enhancement algorithms are shown. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Singular optics methods for analysis of spatial structure of diffraction field of optical elements Article published earlier |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine |
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DSpace DC |
| title |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| spellingShingle |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements Budnyk, O.P. Lymarenko, R.A. |
| title_short |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| title_full |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| title_fullStr |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| title_full_unstemmed |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| title_sort |
singular optics methods for analysis of spatial structure of diffraction field of optical elements |
| author |
Budnyk, O.P. Lymarenko, R.A. |
| author_facet |
Budnyk, O.P. Lymarenko, R.A. |
| publishDate |
2003 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
The paper is devoted to developing methods of analytical and experimental investigations of diffraction and interference phenomena used in test systems for optical elements. The theoretical analysis and experimental results illustrate the possibility of describing diffraction phenomena using the objects and methods that were developed in singular optics. It was shown that a system of dislocations in singular component of diffraction field represents its topology. The diffracted field has a system of hidden optical vortices that are smoothly transformed during deformation of an aperture depending on boundary flexion. The proposed experimental proof ground can be useful for the analysis of a wavefront structure. It is also considered the technique for more accurate evaluation of Ronchi test results. The mathematical background of the Ronchi test technique is developed. It describes sufficiently well the wavefront shape, grating plate parameters, image sensor characteristics, parameters of image acquisition and restoration. The fringe pattern distributions and their spatial spectrum are calculated. Both the results of computer simulation of Ronchi fringe pattern and experimental ones obtained using image sensor and the applied image enhancement algorithms are shown.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118054 |
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| citation_txt |
Singular optics methods for analysis of spatial structure of diffraction field of optical elements / O.P. Budnyk, R.A. Lymarenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 417-422. — Бібліогр.: 13 назв. — англ. |
| work_keys_str_mv |
AT budnykop singularopticsmethodsforanalysisofspatialstructureofdiffractionfieldofopticalelements AT lymarenkora singularopticsmethodsforanalysisofspatialstructureofdiffractionfieldofopticalelements |
| first_indexed |
2025-11-24T10:57:47Z |
| last_indexed |
2025-11-24T10:57:47Z |
| _version_ |
1850845257890004992 |