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Singular optics methods for analysis of spatial structure of diffraction field of optical elements

The paper is devoted to developing methods of analytical and experimental investigations of diffraction and interference phenomena used in test systems for optical elements. The theoretical analysis and experimental results illustrate the possibility of describing diffraction phenomena using the obj...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2003
Hauptverfasser: Budnyk, O.P., Lymarenko, R.A.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118054
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Singular optics methods for analysis of spatial structure of diffraction field of optical elements / O.P. Budnyk, R.A. Lymarenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 417-422. — Бібліогр.: 13 назв. — англ.

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