Stress-induced effects in light scattering by plasmons in p-type germanium

Infrared light scattering by plasmons in p-Ge has been studied under uniaxial stress along the [110] axis with polarization of incident light parallel to the stress direction. It is found that the deformation of the crystal results in an increase of the plasma frequency and lowering the asymmetry of...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2003
Hauptverfasser: Poroshin, V.N., Gaydar, A.V., Abramov, A.A., Tulupenko, V.N.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118080
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Stress-induced effects in light scattering by plasmons in p-type germanium / V.N. Poroshin, A.V. Gaydar, A.A. Abramov, V.N. Tulupenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 425-430. — Бібліогр.: 19 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118080
record_format dspace
spelling Poroshin, V.N.
Gaydar, A.V.
Abramov, A.A.
Tulupenko, V.N.
2017-05-28T16:38:46Z
2017-05-28T16:38:46Z
2003
Stress-induced effects in light scattering by plasmons in p-type germanium / V.N. Poroshin, A.V. Gaydar, A.A. Abramov, V.N. Tulupenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 425-430. — Бібліогр.: 19 назв. — англ.
1560-8034
PACS: 78.40. Fy, 73.20. Mf
https://nasplib.isofts.kiev.ua/handle/123456789/118080
Infrared light scattering by plasmons in p-Ge has been studied under uniaxial stress along the [110] axis with polarization of incident light parallel to the stress direction. It is found that the deformation of the crystal results in an increase of the plasma frequency and lowering the asymmetry of the line by plasma scattering. These effects are explained by taking into account the change of contribution to the dielectric constant caused by the intra- and intersubband transitions as a consequence of variation of the energy band of p-Ge related with deformation.
The authors are grateful to F.T. Vasko and O.G. Sarbey for the discussion of results and to V.M. Vasetski for his assistance in carrying out the experiments.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Stress-induced effects in light scattering by plasmons in p-type germanium
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Stress-induced effects in light scattering by plasmons in p-type germanium
spellingShingle Stress-induced effects in light scattering by plasmons in p-type germanium
Poroshin, V.N.
Gaydar, A.V.
Abramov, A.A.
Tulupenko, V.N.
title_short Stress-induced effects in light scattering by plasmons in p-type germanium
title_full Stress-induced effects in light scattering by plasmons in p-type germanium
title_fullStr Stress-induced effects in light scattering by plasmons in p-type germanium
title_full_unstemmed Stress-induced effects in light scattering by plasmons in p-type germanium
title_sort stress-induced effects in light scattering by plasmons in p-type germanium
author Poroshin, V.N.
Gaydar, A.V.
Abramov, A.A.
Tulupenko, V.N.
author_facet Poroshin, V.N.
Gaydar, A.V.
Abramov, A.A.
Tulupenko, V.N.
publishDate 2003
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Infrared light scattering by plasmons in p-Ge has been studied under uniaxial stress along the [110] axis with polarization of incident light parallel to the stress direction. It is found that the deformation of the crystal results in an increase of the plasma frequency and lowering the asymmetry of the line by plasma scattering. These effects are explained by taking into account the change of contribution to the dielectric constant caused by the intra- and intersubband transitions as a consequence of variation of the energy band of p-Ge related with deformation.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118080
citation_txt Stress-induced effects in light scattering by plasmons in p-type germanium / V.N. Poroshin, A.V. Gaydar, A.A. Abramov, V.N. Tulupenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 425-430. — Бібліогр.: 19 назв. — англ.
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AT tulupenkovn stressinducedeffectsinlightscatteringbyplasmonsinptypegermanium
first_indexed 2025-12-07T16:23:51Z
last_indexed 2025-12-07T16:23:51Z
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