High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films

The paper provides the direct experimental method to determine the localized state energy distribution function for semiconducting solid materials based on space-charge-limited current-voltage characteristics. The current-voltage characteristics would be obtained under the random temperatures. The T...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2003
Main Authors: Opanasyuk, A.S., Opanasyuk, N.N., Tirkusova, N.V.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/118084
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films / A.S. Opanasyuk, N.N. Opanasyuk, N.V. Tirkusova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 444-449. — Бібліогр.: 18 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118084
record_format dspace
spelling Opanasyuk, A.S.
Opanasyuk, N.N.
Tirkusova, N.V.
2017-05-28T16:42:09Z
2017-05-28T16:42:09Z
2003
High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films / A.S. Opanasyuk, N.N. Opanasyuk, N.V. Tirkusova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 444-449. — Бібліогр.: 18 назв. — англ.
1560-8034
PACS: 71.55.-i, 73.50.-h
https://nasplib.isofts.kiev.ua/handle/123456789/118084
The paper provides the direct experimental method to determine the localized state energy distribution function for semiconducting solid materials based on space-charge-limited current-voltage characteristics. The current-voltage characteristics would be obtained under the random temperatures. The Tikhonov regularization method was used to solve the Fredholm 1st rank equation. The method developed in this research was used for the study of deep traps in CdTe polycrystalline films obtained in quasi-closed-tube on the conducting substrate. In the bend gap of the material, some traps were traced, which can be described by the close to Gaussian distribution parameters as well as by the parameter of energy disorder = 0.015-0.04 eV. The research shows that the trap concentration and depend on the physical and technological conditions of the obtained films, while the energy of the traps depends on the impurity-defective material structure.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films
spellingShingle High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films
Opanasyuk, A.S.
Opanasyuk, N.N.
Tirkusova, N.V.
title_short High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films
title_full High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films
title_fullStr High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films
title_full_unstemmed High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films
title_sort high-temperature injection spectroscopy of deep traps in cdte polycrystalline films
author Opanasyuk, A.S.
Opanasyuk, N.N.
Tirkusova, N.V.
author_facet Opanasyuk, A.S.
Opanasyuk, N.N.
Tirkusova, N.V.
publishDate 2003
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The paper provides the direct experimental method to determine the localized state energy distribution function for semiconducting solid materials based on space-charge-limited current-voltage characteristics. The current-voltage characteristics would be obtained under the random temperatures. The Tikhonov regularization method was used to solve the Fredholm 1st rank equation. The method developed in this research was used for the study of deep traps in CdTe polycrystalline films obtained in quasi-closed-tube on the conducting substrate. In the bend gap of the material, some traps were traced, which can be described by the close to Gaussian distribution parameters as well as by the parameter of energy disorder = 0.015-0.04 eV. The research shows that the trap concentration and depend on the physical and technological conditions of the obtained films, while the energy of the traps depends on the impurity-defective material structure.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118084
citation_txt High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films / A.S. Opanasyuk, N.N. Opanasyuk, N.V. Tirkusova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 444-449. — Бібліогр.: 18 назв. — англ.
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first_indexed 2025-11-29T10:35:50Z
last_indexed 2025-11-29T10:35:50Z
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