Dislocations as internal sources of infrared radiation in crystals subjected to ultrasonic influence
We have carried out a systematic study of mercury cadmium telluride crystals
 subjected to the high-frequency and high-intensity ultrasonic influence. The charge carrier
 transport parameters were determined from the Hall coefficient and conductivity
 measurements. Temperatur...
Збережено в:
| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2007 |
| Автори: | , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2007
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/118124 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Dislocations as internal sources of infrared radiation in crystals subjected to ultrasonic influence / R.K. Savkina, A.B. Smirnov, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 3. — С. 61-64. — Бібліогр.: 15 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | We have carried out a systematic study of mercury cadmium telluride crystals
subjected to the high-frequency and high-intensity ultrasonic influence. The charge carrier
transport parameters were determined from the Hall coefficient and conductivity
measurements. Temperature dependences of the electron concentration without and during
the ultrasonic load were calculated. A good agreement between the experimental and
theoretical data was obtained. A model of internal source of the infrared radiation
associated with a dislocation is proposed for the explanation of sonically stimulated effects in the semiconductor system. We have considered a possibility of the thermooptical excitation in Hg₁₋xCdxTe alloys during sonication, which can result in the nonequilibrium
charge carrier generation and changes in electrical parameters of the material.
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| ISSN: | 1560-8034 |