Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures
For the first time, an anomalous strong increase of the Cr²⁺ emission intensity (I) with increasing the applied voltage (V) has been discovered in ZnS:Cr thin-film electroluminescent structures (TFELS) instead of the I(V) dependence saturation typical of TFELS of the MISIM type, where M is an...
Gespeichert in:
| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 2007 |
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2007
|
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118131 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures / N.A. Vlasenko, P.F. Oleksenko, Z.L. Denisova, M.A. Mukhlyo, L.I. Veligura // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 3. — С. 87-90. — Бібліогр.: 13 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-118131 |
|---|---|
| record_format |
dspace |
| spelling |
Vlasenko, N.A. Oleksenko, P.F. Denisova, Z.L. Mukhlyo, M.A. Veligura, L.I. 2017-05-28T18:05:01Z 2017-05-28T18:05:01Z 2007 Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures / N.A. Vlasenko, P.F. Oleksenko, Z.L. Denisova, M.A. Mukhlyo, L.I. Veligura // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 3. — С. 87-90. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS 78.60.Fi, 73.50.Fq, 71.55.Gs, 68.55.L https://nasplib.isofts.kiev.ua/handle/123456789/118131 For the first time, an anomalous strong increase of the Cr²⁺ emission intensity (I) with increasing the applied voltage (V) has been discovered in ZnS:Cr thin-film electroluminescent structures (TFELS) instead of the I(V) dependence saturation typical of TFELS of the MISIM type, where M is an electrode, I is an insulator layer and S is an EL film. The dependence of I on the transferred charge (Q) is very superlinear, whereas the luminance of the emission of hot electrons, which takes place simultaneously with the Cr²⁺ emission, increases proportionally to Q as it happens usually in TFELS. The increase of I and Q is accompanied by rising the sample temperature up to 30 – 50 °C. However, the emission spectrum that is inherent to the ⁵E → ⁵T₂ transition in the 3d shell of a Cr²⁺ ion is not changed in this case. The above effects are explained by Cr⁺ → Cr²⁺ thermofield recharging, which results in an increase of the number not only of free electrons, but also of Cr²⁺ radiation centers. The most probable mechanism of such a recharging is the Frenkel-Pool field-stimulated thermal ionization of Cr⁺ ions, whose ionization energy is 0.65…0.82 eV. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures |
| spellingShingle |
Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures Vlasenko, N.A. Oleksenko, P.F. Denisova, Z.L. Mukhlyo, M.A. Veligura, L.I. |
| title_short |
Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures |
| title_full |
Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures |
| title_fullStr |
Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures |
| title_full_unstemmed |
Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures |
| title_sort |
thermofield cr→cr²⁺ recharging resulting in anomalous intensification of cr²⁺ emission in zns:cr thin-film electroluminescent structures |
| author |
Vlasenko, N.A. Oleksenko, P.F. Denisova, Z.L. Mukhlyo, M.A. Veligura, L.I. |
| author_facet |
Vlasenko, N.A. Oleksenko, P.F. Denisova, Z.L. Mukhlyo, M.A. Veligura, L.I. |
| publishDate |
2007 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
For the first time, an anomalous strong increase of the Cr²⁺ emission intensity
(I) with increasing the applied voltage (V) has been discovered in ZnS:Cr thin-film
electroluminescent structures (TFELS) instead of the I(V) dependence saturation typical
of TFELS of the MISIM type, where M is an electrode, I is an insulator layer and S is an
EL film. The dependence of I on the transferred charge (Q) is very superlinear, whereas
the luminance of the emission of hot electrons, which takes place simultaneously with the
Cr²⁺ emission, increases proportionally to Q as it happens usually in TFELS. The
increase of I and Q is accompanied by rising the sample temperature up to 30 – 50 °C.
However, the emission spectrum that is inherent to the ⁵E → ⁵T₂ transition in the 3d shell
of a Cr²⁺ ion is not changed in this case. The above effects are explained by Cr⁺ → Cr²⁺
thermofield recharging, which results in an increase of the number not only of free
electrons, but also of Cr²⁺ radiation centers. The most probable mechanism of such a
recharging is the Frenkel-Pool field-stimulated thermal ionization of Cr⁺
ions, whose ionization energy is 0.65…0.82 eV.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118131 |
| citation_txt |
Thermofield Cr→Cr²⁺ recharging resulting in anomalous intensification of Cr²⁺ emission in ZnS:Cr thin-film electroluminescent structures / N.A. Vlasenko, P.F. Oleksenko, Z.L. Denisova, M.A. Mukhlyo, L.I. Veligura // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 3. — С. 87-90. — Бібліогр.: 13 назв. — англ. |
| work_keys_str_mv |
AT vlasenkona thermofieldcrcr2rechargingresultinginanomalousintensificationofcr2emissioninznscrthinfilmelectroluminescentstructures AT oleksenkopf thermofieldcrcr2rechargingresultinginanomalousintensificationofcr2emissioninznscrthinfilmelectroluminescentstructures AT denisovazl thermofieldcrcr2rechargingresultinginanomalousintensificationofcr2emissioninznscrthinfilmelectroluminescentstructures AT mukhlyoma thermofieldcrcr2rechargingresultinginanomalousintensificationofcr2emissioninznscrthinfilmelectroluminescentstructures AT veligurali thermofieldcrcr2rechargingresultinginanomalousintensificationofcr2emissioninznscrthinfilmelectroluminescentstructures |
| first_indexed |
2025-12-07T21:12:15Z |
| last_indexed |
2025-12-07T21:12:15Z |
| _version_ |
1850885470249025536 |