Metrological support of satellite-borne UV-spectrometry using a backscattering technique
Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered....
Gespeichert in:
| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 2004 |
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2004
|
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118144 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-118144 |
|---|---|
| record_format |
dspace |
| spelling |
Vashchenko, V. Patlashenko, Zh. Chernysh, E. 2017-05-28T18:33:12Z 2017-05-28T18:33:12Z 2004 Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ. 1560-8034 PACS: 07.60.Rd https://nasplib.isofts.kiev.ua/handle/123456789/118144 Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Metrological support of satellite-borne UV-spectrometry using a backscattering technique Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique |
| spellingShingle |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique Vashchenko, V. Patlashenko, Zh. Chernysh, E. |
| title_short |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique |
| title_full |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique |
| title_fullStr |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique |
| title_full_unstemmed |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique |
| title_sort |
metrological support of satellite-borne uv-spectrometry using a backscattering technique |
| author |
Vashchenko, V. Patlashenko, Zh. Chernysh, E. |
| author_facet |
Vashchenko, V. Patlashenko, Zh. Chernysh, E. |
| publishDate |
2004 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118144 |
| citation_txt |
Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ. |
| work_keys_str_mv |
AT vashchenkov metrologicalsupportofsatelliteborneuvspectrometryusingabackscatteringtechnique AT patlashenkozh metrologicalsupportofsatelliteborneuvspectrometryusingabackscatteringtechnique AT chernyshe metrologicalsupportofsatelliteborneuvspectrometryusingabackscatteringtechnique |
| first_indexed |
2025-12-01T14:45:10Z |
| last_indexed |
2025-12-01T14:45:10Z |
| _version_ |
1850860483389685760 |