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Ellipsometric control of quality of polished MgF₂ optical ceramics

In this work, ellipsometric measurements were used to optimise the technology of machine working the polished parts made of MgF₂ optical ceramics. The ellipsometry is a high-performance contactless method to control quality of optical surfaces, which is used here due to a sharp response of light pol...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2004
Hauptverfasser: Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2004
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118175
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Ellipsometric control of quality of polished MgF₂ optical ceramics / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 2. — С. 199-201. — Бібліогр.: 9 назв. — англ.

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