Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”
The elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of ellipsometry, the influence of elastic deformation on the residual ellipticity of p...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 2004 |
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2004
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118181 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 2. — С. 224-226. — Бібліогр.: 8 назв. — англ. |
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Maslov, V.P. Sarsembaeva, A.Z. Sizov, F.F. 2017-05-29T05:41:05Z 2017-05-29T05:41:05Z 2004 Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 2. — С. 224-226. — Бібліогр.: 8 назв. — англ. 1560-8034 PACS: 81.05.Je https://nasplib.isofts.kiev.ua/handle/123456789/118181 The elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of ellipsometry, the influence of elastic deformation on the residual ellipticity of polished samples made of optical materials was studied. The results obtained during the researches have shown that the appli- cation of elastic deformations leads to essential changes of the minimum ellipticity tgρ of polished samples, which testifies to the necessity to take into account this circumstance for devices of adaptive optics, input windows, cryostats and other optical parts working with the changing temperature. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” |
| spellingShingle |
Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” Maslov, V.P. Sarsembaeva, A.Z. Sizov, F.F. |
| title_short |
Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” |
| title_full |
Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” |
| title_fullStr |
Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” |
| title_full_unstemmed |
Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” |
| title_sort |
erratum: to the paper “influence of elastic deformation on the residual ellipticity of polished optical materials” |
| author |
Maslov, V.P. Sarsembaeva, A.Z. Sizov, F.F. |
| author_facet |
Maslov, V.P. Sarsembaeva, A.Z. Sizov, F.F. |
| publishDate |
2004 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
The elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of
ellipsometry, the influence of elastic deformation on the residual ellipticity of polished samples made of optical materials was studied. The results obtained during the researches have shown that the appli- cation of elastic deformations leads to essential changes of the minimum ellipticity tgρ of polished samples, which testifies to the necessity to take into account this circumstance for devices of adaptive optics, input windows, cryostats and
other optical parts working with the changing temperature.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118181 |
| citation_txt |
Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 2. — С. 224-226. — Бібліогр.: 8 назв. — англ. |
| work_keys_str_mv |
AT maslovvp erratumtothepaperinfluenceofelasticdeformationontheresidualellipticityofpolishedopticalmaterials AT sarsembaevaaz erratumtothepaperinfluenceofelasticdeformationontheresidualellipticityofpolishedopticalmaterials AT sizovff erratumtothepaperinfluenceofelasticdeformationontheresidualellipticityofpolishedopticalmaterials |
| first_indexed |
2025-12-07T17:36:28Z |
| last_indexed |
2025-12-07T17:36:28Z |
| _version_ |
1850871894713040896 |