Gomeniuk, Y. (2012). Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Gomeniuk, Yu.V. "Determination of Interface State Density in High-k Dielectric-silicon System from Conductance-frequency Measurements." Semiconductor Physics Quantum Electronics & Optoelectronics 2012.
MLA-Zitierstil (8. Ausg.)Gomeniuk, Yu.V. "Determination of Interface State Density in High-k Dielectric-silicon System from Conductance-frequency Measurements." Semiconductor Physics Quantum Electronics & Optoelectronics, 2012.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.