APA (7th ed.) Citation

Gomeniuk, Y. (2012). Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Gomeniuk, Yu.V. "Determination of Interface State Density in High-k Dielectric-silicon System from Conductance-frequency Measurements." Semiconductor Physics Quantum Electronics & Optoelectronics 2012.

MLA (8th ed.) Citation

Gomeniuk, Yu.V. "Determination of Interface State Density in High-k Dielectric-silicon System from Conductance-frequency Measurements." Semiconductor Physics Quantum Electronics & Optoelectronics, 2012.

Warning: These citations may not always be 100% accurate.