Effect of nanosize metal overlayer on C₆₀ thin film optical parameters near fundamental absorption edge

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2012
• Hauptverfasser: Dmitruk, N.L., Borkovskaya, O.Yu., Naumenko, D.O., Havrylenko, T.S., Basiuk, E., Shpilevsky, E.M.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/118275
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Effect of nanosize metal overlayer on C₆₀ thin film optical parameters near fundamental absorption edge / N.L. Dmitruk, O.Yu. Borkovskaya, D.O. Naumenko, T.S. Havrylenko, E. Basiuk, E.M. Shpilevsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 1. — С. 61-64. — Бібліогр.: 8 назв. — англ.

The effect of nanosize metal overlayer, both evaporated on C₆₀ films (Bi, In) and attached as nanoparticles of (Ag, Au), on the optical parameters of C₆₀ films near the fundamental absorption edge has been studied. The values of direct band gap (Eg), the optical gap (E₀) in the framework of Tauc model and the Urbach tail parameter (EU) were determined from the absorption coefficient (α) spectra plotted in coordinates (αhν)², (αhν)¹/² ln(α) vs hν, respectively. Parameters obtained testify diminishing the structural disorder in C₆₀ thin films with nanosize metal overlayer at optimal ratio of C₆₀ to metal layer thicknesses.