Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions

The nonlinear boundary axially symmetric problem of heat conduction for the thermosensitive piecewise homogeneous layer with reach-through cylindrical inclusion that generates heat has been considered. Using the introduced function, the partial linearization of the original problem has been carri...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2012
1. Verfasser: Gavrysh, V.I.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118314
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions / V.I Gavrysh.// Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 3. — С. 247-251. — Бібліогр.: 13 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118314
record_format dspace
spelling Gavrysh, V.I.
2017-05-29T16:50:26Z
2017-05-29T16:50:26Z
2012
Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions / V.I Gavrysh.// Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 3. — С. 247-251. — Бібліогр.: 13 назв. — англ.
1560-8034
PACS 74.25.fc
https://nasplib.isofts.kiev.ua/handle/123456789/118314
The nonlinear boundary axially symmetric problem of heat conduction for the thermosensitive piecewise homogeneous layer with reach-through cylindrical inclusion that generates heat has been considered. Using the introduced function, the partial linearization of the original problem has been carried out. With the proposed piecewiselinear approximation of temperature at the boundary surface of the foreign inclusion and on the contact surface of the homogeneous elements of the layer, the problem has been completely linearized. The analytical solution of this problem of finding the introduced function using Hankel integral transform has been formed. The formulae for calculating the desired temperature have been derived.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions
spellingShingle Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions
Gavrysh, V.I.
title_short Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions
title_full Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions
title_fullStr Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions
title_full_unstemmed Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions
title_sort thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions
author Gavrysh, V.I.
author_facet Gavrysh, V.I.
publishDate 2012
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The nonlinear boundary axially symmetric problem of heat conduction for the thermosensitive piecewise homogeneous layer with reach-through cylindrical inclusion that generates heat has been considered. Using the introduced function, the partial linearization of the original problem has been carried out. With the proposed piecewiselinear approximation of temperature at the boundary surface of the foreign inclusion and on the contact surface of the homogeneous elements of the layer, the problem has been completely linearized. The analytical solution of this problem of finding the introduced function using Hankel integral transform has been formed. The formulae for calculating the desired temperature have been derived.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118314
citation_txt Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions / V.I Gavrysh.// Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 3. — С. 247-251. — Бібліогр.: 13 назв. — англ.
work_keys_str_mv AT gavryshvi thermalstatemodelinginthermosensitiveelementsofmicroelectronicdeviceswithreachthroughforeigninclusions
first_indexed 2025-12-07T15:53:04Z
last_indexed 2025-12-07T15:53:04Z
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