Nanoprobe spectroscopy of capillary forces and its application for a real surface diagnostics

The paper presents an overview and analysis of the most reliable and at the same time rather simple theoretical models describing liquid nanomeniscus geometry and forces occurring between atomic force microscope (AFM) probe and a real surface. There are experimental results in capillary bridge fo...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2010
Hauptverfasser: Efremov, A.A., Lytvyn, P.M., Anishchenko, А.O., Dyachyns’ka, O.M., Aleksyeyeva, T.A., Prokopenko, I.V.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118328
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Nanoprobe spectroscopy of capillary forces and its application for a real surface diagnostics / A.A. Efremov, P.M. Lytvyn, А.O. Anishchenko, O.M. Dyachyns’ka, T.A. Aleksyeyeva, I.V. Prokopenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 2. — С. 111-124. — Бібліогр.: 26 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine