Analysis of features of recombination mechanisms in silicon solar cells

Investigated in this paper are theoretical and experimental spectral
 dependences of the short-circuit current as well as small-signal photo-e.m.f. in silicon
 solar cells. The authors have considered two constructions of solar cells. The first
 construction is a solar cell w...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2014
Main Authors: Korkishko, R.M., Kostylyov, V.P., Prima, N.A., Sachenko, A.V., Serba, O.A., Slusar, T.V., Chernenko, V.V.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/118353
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Analysis of features of recombination mechanisms
 in silicon solar cells / R.M. Korkishko, V.P. Kostylyov, N.A. Prima, A.V. Sachenko, O.A. Serba, T.V. Slusar, V.V. Chernenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 14-20. — Бібліогр.: 8 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
_version_ 1862716573983178752
author Korkishko, R.M.
Kostylyov, V.P.
Prima, N.A.
Sachenko, A.V.
Serba, O.A.
Slusar, T.V.
Chernenko, V.V.
author_facet Korkishko, R.M.
Kostylyov, V.P.
Prima, N.A.
Sachenko, A.V.
Serba, O.A.
Slusar, T.V.
Chernenko, V.V.
citation_txt Analysis of features of recombination mechanisms
 in silicon solar cells / R.M. Korkishko, V.P. Kostylyov, N.A. Prima, A.V. Sachenko, O.A. Serba, T.V. Slusar, V.V. Chernenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 14-20. — Бібліогр.: 8 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Investigated in this paper are theoretical and experimental spectral
 dependences of the short-circuit current as well as small-signal photo-e.m.f. in silicon
 solar cells. The authors have considered two constructions of solar cells. The first
 construction is a solar cell with contacts on the front and back surfaces, and the second –
 solar cells with back barriers and contact metallization. Analyzed in the work are spectral
 dependences of the internal quantum efficiency for the short-circuit current and smallsignal
 photo-e.m.f.
 It has been shown that the short-wave drop of the short-circuit current is related with
 recombination on deep centers at the front surface as well as inter-band Auger
 recombination in the heavily doped emitter. At the same time, availability of the shortwave
 drop in the small-signal photo-e.m.f. is related with limitation of the efficient rate
 of surface recombination Seff(l) due to diffusion inflow.
 The latter takes place when a layer with the thickness dp and increased recombination is
 available near illuminated surface. In this case, the mechanism providing decrease in the
 small-signal photo-e.m.f. in the area of strong light absorption is related with increasing
 the efficient rate of surface recombination near the front surface, when the dominant
 amount of electro-hole pairs is generated in the layer with the increased recombination
 rate. The same mechanism is responsible for the short-circuit current drop in solar cells
 with back barriers and contact metallization.
 Juxtaposition of theoretical and experimental results enabled to determine parameters
 that characterize sub-surface properties of solar cells, namely: the thickness of the
 surface layer with increased recombination, lifetime of carriers in it, and dependences
 Seff(l).
first_indexed 2025-12-07T18:05:30Z
format Article
fulltext
id nasplib_isofts_kiev_ua-123456789-118353
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-07T18:05:30Z
publishDate 2014
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Korkishko, R.M.
Kostylyov, V.P.
Prima, N.A.
Sachenko, A.V.
Serba, O.A.
Slusar, T.V.
Chernenko, V.V.
2017-05-30T05:35:29Z
2017-05-30T05:35:29Z
2014
Analysis of features of recombination mechanisms
 in silicon solar cells / R.M. Korkishko, V.P. Kostylyov, N.A. Prima, A.V. Sachenko, O.A. Serba, T.V. Slusar, V.V. Chernenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 14-20. — Бібліогр.: 8 назв. — англ.
1560-8034
PACS 88.40.Jj
https://nasplib.isofts.kiev.ua/handle/123456789/118353
Investigated in this paper are theoretical and experimental spectral
 dependences of the short-circuit current as well as small-signal photo-e.m.f. in silicon
 solar cells. The authors have considered two constructions of solar cells. The first
 construction is a solar cell with contacts on the front and back surfaces, and the second –
 solar cells with back barriers and contact metallization. Analyzed in the work are spectral
 dependences of the internal quantum efficiency for the short-circuit current and smallsignal
 photo-e.m.f.
 It has been shown that the short-wave drop of the short-circuit current is related with
 recombination on deep centers at the front surface as well as inter-band Auger
 recombination in the heavily doped emitter. At the same time, availability of the shortwave
 drop in the small-signal photo-e.m.f. is related with limitation of the efficient rate
 of surface recombination Seff(l) due to diffusion inflow.
 The latter takes place when a layer with the thickness dp and increased recombination is
 available near illuminated surface. In this case, the mechanism providing decrease in the
 small-signal photo-e.m.f. in the area of strong light absorption is related with increasing
 the efficient rate of surface recombination near the front surface, when the dominant
 amount of electro-hole pairs is generated in the layer with the increased recombination
 rate. The same mechanism is responsible for the short-circuit current drop in solar cells
 with back barriers and contact metallization.
 Juxtaposition of theoretical and experimental results enabled to determine parameters
 that characterize sub-surface properties of solar cells, namely: the thickness of the
 surface layer with increased recombination, lifetime of carriers in it, and dependences
 Seff(l).
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Analysis of features of recombination mechanisms in silicon solar cells
Article
published earlier
spellingShingle Analysis of features of recombination mechanisms in silicon solar cells
Korkishko, R.M.
Kostylyov, V.P.
Prima, N.A.
Sachenko, A.V.
Serba, O.A.
Slusar, T.V.
Chernenko, V.V.
title Analysis of features of recombination mechanisms in silicon solar cells
title_full Analysis of features of recombination mechanisms in silicon solar cells
title_fullStr Analysis of features of recombination mechanisms in silicon solar cells
title_full_unstemmed Analysis of features of recombination mechanisms in silicon solar cells
title_short Analysis of features of recombination mechanisms in silicon solar cells
title_sort analysis of features of recombination mechanisms in silicon solar cells
url https://nasplib.isofts.kiev.ua/handle/123456789/118353
work_keys_str_mv AT korkishkorm analysisoffeaturesofrecombinationmechanismsinsiliconsolarcells
AT kostylyovvp analysisoffeaturesofrecombinationmechanismsinsiliconsolarcells
AT primana analysisoffeaturesofrecombinationmechanismsinsiliconsolarcells
AT sachenkoav analysisoffeaturesofrecombinationmechanismsinsiliconsolarcells
AT serbaoa analysisoffeaturesofrecombinationmechanismsinsiliconsolarcells
AT slusartv analysisoffeaturesofrecombinationmechanismsinsiliconsolarcells
AT chernenkovv analysisoffeaturesofrecombinationmechanismsinsiliconsolarcells