Morphologic and optical characterization of ZnO:Co thin films grown by PLD
The morphological properties of the surface and optical characteristics of
 nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and
 sapphire by pulsed laser deposition (PLD) method have been studied. The influence of
 thermal annealing on formation...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Дата: | 2014 |
| Автори: | , , , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2014
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/118359 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Morphologic and optical characterization
 of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862690523535376384 |
|---|---|
| author | Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. |
| author_facet | Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. |
| citation_txt | Morphologic and optical characterization
 of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The morphological properties of the surface and optical characteristics of
nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and
sapphire by pulsed laser deposition (PLD) method have been studied. The influence of
thermal annealing on formation of characteristically developed surface of films has been
analyzed. The experimental transmission and reflectance spectra in the visible region
have been measured. In the framework of the dielectric function, the optical constants n
and k and dispersion parameters of oscillators that provide the best fit with experimental
data have been obtained. From the infrared reflectance spectra of ZnO:Co structures, the
frequency positions of Е₁(LO) and Е₁(ТО) optical phonons have been determined. It
gives a possibility to suppose that the obtained films possess the wurtzite structure.
|
| first_indexed | 2025-12-07T16:14:23Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-118359 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T16:14:23Z |
| publishDate | 2014 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. 2017-05-30T05:44:28Z 2017-05-30T05:44:28Z 2014 Morphologic and optical characterization
 of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS 68.37.Ps, 78.20.Ci, 78.30.-j https://nasplib.isofts.kiev.ua/handle/123456789/118359 The morphological properties of the surface and optical characteristics of
 nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and
 sapphire by pulsed laser deposition (PLD) method have been studied. The influence of
 thermal annealing on formation of characteristically developed surface of films has been
 analyzed. The experimental transmission and reflectance spectra in the visible region
 have been measured. In the framework of the dielectric function, the optical constants n
 and k and dispersion parameters of oscillators that provide the best fit with experimental
 data have been obtained. From the infrared reflectance spectra of ZnO:Co structures, the
 frequency positions of Е₁(LO) and Е₁(ТО) optical phonons have been determined. It
 gives a possibility to suppose that the obtained films possess the wurtzite structure. This work was partially sponsored by Ukrainian-Russian
 Research Project “Developing of photo- and gas
 sensitive nanocomposites on the base of semiconductor
 oxides that are sensibilized by II-VI quantum dots”. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Morphologic and optical characterization of ZnO:Co thin films grown by PLD Article published earlier |
| spellingShingle | Morphologic and optical characterization of ZnO:Co thin films grown by PLD Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. |
| title | Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_full | Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_fullStr | Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_full_unstemmed | Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_short | Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_sort | morphologic and optical characterization of zno:co thin films grown by pld |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/118359 |
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