Morphologic and optical characterization of ZnO:Co thin films grown by PLD
The morphological properties of the surface and optical characteristics of nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and sapphire by pulsed laser deposition (PLD) method have been studied. The influence of thermal annealing on formation of characteristically d...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2014 |
| Автори: | , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2014
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/118359 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Morphologic and optical characterization of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-118359 |
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Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. 2017-05-30T05:44:28Z 2017-05-30T05:44:28Z 2014 Morphologic and optical characterization of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS 68.37.Ps, 78.20.Ci, 78.30.-j https://nasplib.isofts.kiev.ua/handle/123456789/118359 The morphological properties of the surface and optical characteristics of nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and sapphire by pulsed laser deposition (PLD) method have been studied. The influence of thermal annealing on formation of characteristically developed surface of films has been analyzed. The experimental transmission and reflectance spectra in the visible region have been measured. In the framework of the dielectric function, the optical constants n and k and dispersion parameters of oscillators that provide the best fit with experimental data have been obtained. From the infrared reflectance spectra of ZnO:Co structures, the frequency positions of Е₁(LO) and Е₁(ТО) optical phonons have been determined. It gives a possibility to suppose that the obtained films possess the wurtzite structure. This work was partially sponsored by Ukrainian-Russian Research Project “Developing of photo- and gas sensitive nanocomposites on the base of semiconductor oxides that are sensibilized by II-VI quantum dots”. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Morphologic and optical characterization of ZnO:Co thin films grown by PLD Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| spellingShingle |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. |
| title_short |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_full |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_fullStr |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_full_unstemmed |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_sort |
morphologic and optical characterization of zno:co thin films grown by pld |
| author |
Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. |
| author_facet |
Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. |
| publishDate |
2014 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
The morphological properties of the surface and optical characteristics of
nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and
sapphire by pulsed laser deposition (PLD) method have been studied. The influence of
thermal annealing on formation of characteristically developed surface of films has been
analyzed. The experimental transmission and reflectance spectra in the visible region
have been measured. In the framework of the dielectric function, the optical constants n
and k and dispersion parameters of oscillators that provide the best fit with experimental
data have been obtained. From the infrared reflectance spectra of ZnO:Co structures, the
frequency positions of Е₁(LO) and Е₁(ТО) optical phonons have been determined. It
gives a possibility to suppose that the obtained films possess the wurtzite structure.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118359 |
| citation_txt |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. |
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2025-12-07T16:14:23Z |
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2025-12-07T16:14:23Z |
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