Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2010
• ISSN: 1560-8034
• Hauptverfasser: Ushenko, Yu.O., Misevich, I.Z., Angelsky, A.P., Bachinsky, V.T., Telen’ga, O.Yu., Olar, O.I.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/118397
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Polarization-singular structure in laser images
 of phase-inhomogeneous layers to diagnose
 and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ.

Adduced in this work are the results of investigation aimed at analysis of
 coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in
 laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough,
 ground and bulk scattering layers. To characterize polarization maps for all the types of
 PhIL, the authors have offered to use three groups of parameters: statistical moments of
 the first to fourth orders, autocorrelation functions, logarithmic dependences for power
 spectra related to distributions of azimuths and ellipticity of polarization inherent to PhIL
 laser images. Ascertained are the criteria for diagnostics and classification of PhIL
 optical properties.