Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties

Adduced in this work are the results of investigation aimed at analysis of
 coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in
 laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough,
 ground and bulk scatteri...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2010
Hauptverfasser: Ushenko, Yu.O., Misevich, I.Z., Angelsky, A.P., Bachinsky, V.T., Telen’ga, O.Yu., Olar, O.I.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118397
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Zitieren:Polarization-singular structure in laser images
 of phase-inhomogeneous layers to diagnose
 and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Ushenko, Yu.O.
Misevich, I.Z.
Angelsky, A.P.
Bachinsky, V.T.
Telen’ga, O.Yu.
Olar, O.I.
author_facet Ushenko, Yu.O.
Misevich, I.Z.
Angelsky, A.P.
Bachinsky, V.T.
Telen’ga, O.Yu.
Olar, O.I.
citation_txt Polarization-singular structure in laser images
 of phase-inhomogeneous layers to diagnose
 and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Adduced in this work are the results of investigation aimed at analysis of
 coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in
 laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough,
 ground and bulk scattering layers. To characterize polarization maps for all the types of
 PhIL, the authors have offered to use three groups of parameters: statistical moments of
 the first to fourth orders, autocorrelation functions, logarithmic dependences for power
 spectra related to distributions of azimuths and ellipticity of polarization inherent to PhIL
 laser images. Ascertained are the criteria for diagnostics and classification of PhIL
 optical properties.
first_indexed 2025-12-07T21:18:51Z
format Article
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id nasplib_isofts_kiev_ua-123456789-118397
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-07T21:18:51Z
publishDate 2010
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Ushenko, Yu.O.
Misevich, I.Z.
Angelsky, A.P.
Bachinsky, V.T.
Telen’ga, O.Yu.
Olar, O.I.
2017-05-30T06:53:39Z
2017-05-30T06:53:39Z
2010
Polarization-singular structure in laser images
 of phase-inhomogeneous layers to diagnose
 and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ.
1560-8034
PACS 87.64.-t
https://nasplib.isofts.kiev.ua/handle/123456789/118397
Adduced in this work are the results of investigation aimed at analysis of
 coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in
 laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough,
 ground and bulk scattering layers. To characterize polarization maps for all the types of
 PhIL, the authors have offered to use three groups of parameters: statistical moments of
 the first to fourth orders, autocorrelation functions, logarithmic dependences for power
 spectra related to distributions of azimuths and ellipticity of polarization inherent to PhIL
 laser images. Ascertained are the criteria for diagnostics and classification of PhIL
 optical properties.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
Article
published earlier
spellingShingle Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
Ushenko, Yu.O.
Misevich, I.Z.
Angelsky, A.P.
Bachinsky, V.T.
Telen’ga, O.Yu.
Olar, O.I.
title Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
title_full Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
title_fullStr Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
title_full_unstemmed Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
title_short Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
title_sort polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
url https://nasplib.isofts.kiev.ua/handle/123456789/118397
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