Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
Adduced in this work are the results of investigation aimed at analysis of coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough, ground and bulk scattering layers. To characteri...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Date: | 2010 |
| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2010
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/118397 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-118397 |
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Ushenko, Yu.O. Misevich, I.Z. Angelsky, A.P. Bachinsky, V.T. Telen’ga, O.Yu. Olar, O.I. 2017-05-30T06:53:39Z 2017-05-30T06:53:39Z 2010 Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ. 1560-8034 PACS 87.64.-t https://nasplib.isofts.kiev.ua/handle/123456789/118397 Adduced in this work are the results of investigation aimed at analysis of coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough, ground and bulk scattering layers. To characterize polarization maps for all the types of PhIL, the authors have offered to use three groups of parameters: statistical moments of the first to fourth orders, autocorrelation functions, logarithmic dependences for power spectra related to distributions of azimuths and ellipticity of polarization inherent to PhIL laser images. Ascertained are the criteria for diagnostics and classification of PhIL optical properties. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
| spellingShingle |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties Ushenko, Yu.O. Misevich, I.Z. Angelsky, A.P. Bachinsky, V.T. Telen’ga, O.Yu. Olar, O.I. |
| title_short |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
| title_full |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
| title_fullStr |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
| title_full_unstemmed |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
| title_sort |
polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
| author |
Ushenko, Yu.O. Misevich, I.Z. Angelsky, A.P. Bachinsky, V.T. Telen’ga, O.Yu. Olar, O.I. |
| author_facet |
Ushenko, Yu.O. Misevich, I.Z. Angelsky, A.P. Bachinsky, V.T. Telen’ga, O.Yu. Olar, O.I. |
| publishDate |
2010 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
Adduced in this work are the results of investigation aimed at analysis of
coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in
laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough,
ground and bulk scattering layers. To characterize polarization maps for all the types of
PhIL, the authors have offered to use three groups of parameters: statistical moments of
the first to fourth orders, autocorrelation functions, logarithmic dependences for power
spectra related to distributions of azimuths and ellipticity of polarization inherent to PhIL
laser images. Ascertained are the criteria for diagnostics and classification of PhIL
optical properties.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118397 |
| citation_txt |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ. |
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2025-12-07T21:18:51Z |
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2025-12-07T21:18:51Z |
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