Structural and optical properties of Zn₁₋xCoxO thin films prepared by RF reactive sputtering technique

• Опубліковано в: : Semiconductor Physics Quantum Electronics & Optoelectronics
• Дата: 2014
• Автори: Savchuk, A.I., Stolyarchuk, I.D., Stefanuk, I., Cieniek, B., Sheregii, E.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/118411
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Structural and optical properties of Zn₁₋xCoxO thin films prepared by RF reactive sputtering technique / A.I. Savchuk, I.D. Stolyarchuk, I. Stefanuk, B. Cieniek, E. Sheregii // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 4. — С. 353-357. — Бібліогр.: 31 назв. — англ.

We have reported the effect of Co doping on structural and optical properties
 of ZnO thin films prepared by the RF reactive sputtering technique. The composite
 targets were formed by mixing and pressing ZnO and CoO powders. The thin films were
 deposited on silica and glass substrates. The structures of samples have been studied by
 using X-ray diffraction (XRD) and atomic force microscopy (AFM). With the sensitivity
 of the XRD instruments, the structural analyses of Co-doped ZnO films reveal formation
 of predominant (002) reflection corresponding to the hexagonal wurtzite structure
 without any secondary phase. The AFM study showed that surface morphology of the
 Zn₁₋xCoxO films is composed of closely packed nanocrystallites with nanorod shape.
 The optical properties of the samples were studied using UV-vis absorption and PL
 spectra. The optical absorption spectra show a red shift of the band edge, which indicates
 that Co²⁺ ions substitute Zn²⁺ ions in ZnO lattice. In the room-temperature photoluminescence
 spectra, four main peaks were revealed in all the samples, which are
 attributed to ultraviolet, violet-blue, blue and green emission.