APA (7th ed.) Citation

Rengevych, O., Beketov, G., & Ushenin, Y. (2014). Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Rengevych, O.V, G.V Beketov, and Yu.V Ushenin. "Visualization of Submicron Si-rods by SPR-enhanced Total Internal Reflection Microscopy." Semiconductor Physics Quantum Electronics & Optoelectronics 2014.

MLA (8th ed.) Citation

Rengevych, O.V, et al. "Visualization of Submicron Si-rods by SPR-enhanced Total Internal Reflection Microscopy." Semiconductor Physics Quantum Electronics & Optoelectronics, 2014.

Warning: These citations may not always be 100% accurate.