Rengevych, O., Beketov, G., & Ushenin, Y. (2014). Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Rengevych, O.V, G.V Beketov, und Yu.V Ushenin. "Visualization of Submicron Si-rods by SPR-enhanced Total Internal Reflection Microscopy." Semiconductor Physics Quantum Electronics & Optoelectronics 2014.
MLA-Zitierstil (8. Ausg.)Rengevych, O.V, et al. "Visualization of Submicron Si-rods by SPR-enhanced Total Internal Reflection Microscopy." Semiconductor Physics Quantum Electronics & Optoelectronics, 2014.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.