Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy

• Опубліковано в: : Semiconductor Physics Quantum Electronics & Optoelectronics
• Дата: 2014
• Автори: Rengevych, O.V., Beketov, G.V., Ushenin, Yu.V.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/118417
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Visualization of submicron Si-rods
 by SPR-enhanced total internal reflection microscopy / O.V. Rengevych, G.V. Beketov, Yu.V. Ushenin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 4. — С. 368-373. — Бібліогр.: 31 назв. — англ.

The potential of surface plasmon resonance-enhanced total internal reflection
 microscopy for visualization of submicron particles has been demonstrated using
 submicron-sized silicon rods as a test object. Submicron Si-rods were deposited onto the
 surface of a plasmon-supporting gold film by sedimentation from suspension, and their
 images were obtained using optical microscope with SPR excitation. Quality of images
 obtained in this way was compared with images viewed from the prism side in the SPR
 microscopy configuration. Specific features of light scattering from filiform objects are
 discussed. The study was aimed at development of a novel type of SPR-based biosensor
 relied upon direct count of biological species of interest (bacteria, viruses, large
 biomolecular complexes).