Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy
The potential of surface plasmon resonance-enhanced total internal reflection
 microscopy for visualization of submicron particles has been demonstrated using
 submicron-sized silicon rods as a test object. Submicron Si-rods were deposited onto the
 surface of a plasmon-suppo...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2014 |
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| Format: | Artikel |
| Sprache: | Englisch |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2014
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118417 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Visualization of submicron Si-rods
 by SPR-enhanced total internal reflection microscopy / O.V. Rengevych, G.V. Beketov, Yu.V. Ushenin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 4. — С. 368-373. — Бібліогр.: 31 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862721430056075264 |
|---|---|
| author | Rengevych, O.V. Beketov, G.V. Ushenin, Yu.V. |
| author_facet | Rengevych, O.V. Beketov, G.V. Ushenin, Yu.V. |
| citation_txt | Visualization of submicron Si-rods
 by SPR-enhanced total internal reflection microscopy / O.V. Rengevych, G.V. Beketov, Yu.V. Ushenin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 4. — С. 368-373. — Бібліогр.: 31 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The potential of surface plasmon resonance-enhanced total internal reflection
microscopy for visualization of submicron particles has been demonstrated using
submicron-sized silicon rods as a test object. Submicron Si-rods were deposited onto the
surface of a plasmon-supporting gold film by sedimentation from suspension, and their
images were obtained using optical microscope with SPR excitation. Quality of images
obtained in this way was compared with images viewed from the prism side in the SPR
microscopy configuration. Specific features of light scattering from filiform objects are
discussed. The study was aimed at development of a novel type of SPR-based biosensor
relied upon direct count of biological species of interest (bacteria, viruses, large
biomolecular complexes).
|
| first_indexed | 2025-12-07T18:31:00Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-118417 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T18:31:00Z |
| publishDate | 2014 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Rengevych, O.V. Beketov, G.V. Ushenin, Yu.V. 2017-05-30T10:22:21Z 2017-05-30T10:22:21Z 2014 Visualization of submicron Si-rods
 by SPR-enhanced total internal reflection microscopy / O.V. Rengevych, G.V. Beketov, Yu.V. Ushenin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 4. — С. 368-373. — Бібліогр.: 31 назв. — англ. 1560-8034 PACS 73.20.Mf https://nasplib.isofts.kiev.ua/handle/123456789/118417 The potential of surface plasmon resonance-enhanced total internal reflection
 microscopy for visualization of submicron particles has been demonstrated using
 submicron-sized silicon rods as a test object. Submicron Si-rods were deposited onto the
 surface of a plasmon-supporting gold film by sedimentation from suspension, and their
 images were obtained using optical microscope with SPR excitation. Quality of images
 obtained in this way was compared with images viewed from the prism side in the SPR
 microscopy configuration. Specific features of light scattering from filiform objects are
 discussed. The study was aimed at development of a novel type of SPR-based biosensor
 relied upon direct count of biological species of interest (bacteria, viruses, large
 biomolecular complexes). The authors would like to extend their most sincere
 appreciation to Dr. Prof. A. Klimovskaya for providing
 the submicron-sized silicon nanorods for this study.
 This work was partially supported by Swiss
 National Science Foundation through SCOPES JRP
 IZ73Z0_152661. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy Article published earlier |
| spellingShingle | Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy Rengevych, O.V. Beketov, G.V. Ushenin, Yu.V. |
| title | Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| title_full | Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| title_fullStr | Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| title_full_unstemmed | Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| title_short | Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| title_sort | visualization of submicron si-rods by spr-enhanced total internal reflection microscopy |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/118417 |
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