Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy

• Published in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Date: 2014
• Main Authors: Rengevych, O.V., Beketov, G.V., Ushenin, Yu.V.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/118417
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Visualization of submicron Si-rods
 by SPR-enhanced total internal reflection microscopy / O.V. Rengevych, G.V. Beketov, Yu.V. Ushenin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 4. — С. 368-373. — Бібліогр.: 31 назв. — англ.

The potential of surface plasmon resonance-enhanced total internal reflection
 microscopy for visualization of submicron particles has been demonstrated using
 submicron-sized silicon rods as a test object. Submicron Si-rods were deposited onto the
 surface of a plasmon-suppo...