Sheremet, V. (2014). Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Sheremet, V.N. "Metrological Aspects of Researching the Specific Contact Resistivity of Ohmic Contacts by Using the Four-contact Method." Semiconductor Physics Quantum Electronics & Optoelectronics 2014.
MLA-Zitierstil (8. Ausg.)Sheremet, V.N. "Metrological Aspects of Researching the Specific Contact Resistivity of Ohmic Contacts by Using the Four-contact Method." Semiconductor Physics Quantum Electronics & Optoelectronics, 2014.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.