Sheremet, V. (2014). Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago Style (17th ed.) CitationSheremet, V.N. "Metrological Aspects of Researching the Specific Contact Resistivity of Ohmic Contacts by Using the Four-contact Method." Semiconductor Physics Quantum Electronics & Optoelectronics 2014.
MLA (8th ed.) CitationSheremet, V.N. "Metrological Aspects of Researching the Specific Contact Resistivity of Ohmic Contacts by Using the Four-contact Method." Semiconductor Physics Quantum Electronics & Optoelectronics, 2014.
Warning: These citations may not always be 100% accurate.