Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method
In this paper, we have considered the four-contact method for measurements
 of the specific contact resistivity of the ohmic contacts (ρc). The presented method for
 measuring ρc has been compared with several other methods. Limits of applying this
 method have been shown.
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 2014 |
| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2014
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118426 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Metrological aspects of researching the specific contact resistivity
 of ohmic contacts by using the four-contact method / V.N. Sheremet // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 4. — С. 394-397. — Бібліогр.: 8 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862709840400351232 |
|---|---|
| author | Sheremet, V.N. |
| author_facet | Sheremet, V.N. |
| citation_txt | Metrological aspects of researching the specific contact resistivity
 of ohmic contacts by using the four-contact method / V.N. Sheremet // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 4. — С. 394-397. — Бібліогр.: 8 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | In this paper, we have considered the four-contact method for measurements
of the specific contact resistivity of the ohmic contacts (ρc). The presented method for
measuring ρc has been compared with several other methods. Limits of applying this
method have been shown.
|
| first_indexed | 2025-12-07T17:20:46Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-118426 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T17:20:46Z |
| publishDate | 2014 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Sheremet, V.N. 2017-05-30T10:32:07Z 2017-05-30T10:32:07Z 2014 Metrological aspects of researching the specific contact resistivity
 of ohmic contacts by using the four-contact method / V.N. Sheremet // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 4. — С. 394-397. — Бібліогр.: 8 назв. — англ. 1560-8034 PACS 73.40.Ns, 73.40.Cg, 85.40.-e https://nasplib.isofts.kiev.ua/handle/123456789/118426 In this paper, we have considered the four-contact method for measurements
 of the specific contact resistivity of the ohmic contacts (ρc). The presented method for
 measuring ρc has been compared with several other methods. Limits of applying this
 method have been shown. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method Article published earlier |
| spellingShingle | Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method Sheremet, V.N. |
| title | Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method |
| title_full | Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method |
| title_fullStr | Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method |
| title_full_unstemmed | Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method |
| title_short | Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method |
| title_sort | metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/118426 |
| work_keys_str_mv | AT sheremetvn metrologicalaspectsofresearchingthespecificcontactresistivityofohmiccontactsbyusingthefourcontactmethod |