Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions
(Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films were deposited upon a quartz substrate by
 rapid thermal evaporation at temperatures 1050, 1200, and 1350 °C. Structural studies of
 the as-deposited thin films were carried out by scanning electron microscopy and atomic
 force microscopy. It...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2014 |
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| Format: | Artikel |
| Sprache: | Englisch |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2014
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118484 |
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| Zitieren: | Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions / I.P. Studenyak, Yu.Yu. Neimet, Y.Y. Rati, M.Yu. Buchuk, S. Kokenyesi, L. Daroci, R. Bohdan // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 232-236. — Бібліогр.: 20 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862573775328903168 |
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| author | Studenyak, I.P. Neimet, Yu.Yu. Rati, Y.Y. Buchuk, M.Yu. Kökényesi, S. Daróci, L. Bohdan, R. |
| author_facet | Studenyak, I.P. Neimet, Yu.Yu. Rati, Y.Y. Buchuk, M.Yu. Kökényesi, S. Daróci, L. Bohdan, R. |
| citation_txt | Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions / I.P. Studenyak, Yu.Yu. Neimet, Y.Y. Rati, M.Yu. Buchuk, S. Kokenyesi, L. Daroci, R. Bohdan // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 232-236. — Бібліогр.: 20 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films were deposited upon a quartz substrate by
rapid thermal evaporation at temperatures 1050, 1200, and 1350 °C. Structural studies of
the as-deposited thin films were carried out by scanning electron microscopy and atomic
force microscopy. It is shown that the surfaces of all the films were covered with Ag-rich
crystalline micrometer sized cones. The optical transmission spectra for as-deposited thin
films were studied at room temperature. The absorption spectra in the region of its
exponential behaviour were analyzed, the dispersion dependences of refractive index as
well as their variation depending on evaporation temperature were investigated.
|
| first_indexed | 2025-11-26T08:16:03Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-118484 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-11-26T08:16:03Z |
| publishDate | 2014 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Studenyak, I.P. Neimet, Yu.Yu. Rati, Y.Y. Buchuk, M.Yu. Kökényesi, S. Daróci, L. Bohdan, R. 2017-05-30T14:05:25Z 2017-05-30T14:05:25Z 2014 Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions / I.P. Studenyak, Yu.Yu. Neimet, Y.Y. Rati, M.Yu. Buchuk, S. Kokenyesi, L. Daroci, R. Bohdan // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 232-236. — Бібліогр.: 20 назв. — англ. 1560-8034 PACS 78.40.Ha, 77.80.Bh https://nasplib.isofts.kiev.ua/handle/123456789/118484 (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films were deposited upon a quartz substrate by
 rapid thermal evaporation at temperatures 1050, 1200, and 1350 °C. Structural studies of
 the as-deposited thin films were carried out by scanning electron microscopy and atomic
 force microscopy. It is shown that the surfaces of all the films were covered with Ag-rich
 crystalline micrometer sized cones. The optical transmission spectra for as-deposited thin
 films were studied at room temperature. The absorption spectra in the region of its
 exponential behaviour were analyzed, the dispersion dependences of refractive index as
 well as their variation depending on evaporation temperature were investigated. The authors are grateful to the TAMOP Grant (TAMOP
 4.2.2.A-11/1/KONV-2012-0036 project) which is cofinanced
 by the European Union and European Social
 Fund. Yuriy Neimet (contract number 51301014) is
 strongly grateful to the International Visegrad Fund
 scholarship for the funding of the project. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions Article published earlier |
| spellingShingle | Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions Studenyak, I.P. Neimet, Yu.Yu. Rati, Y.Y. Buchuk, M.Yu. Kökényesi, S. Daróci, L. Bohdan, R. |
| title | Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions |
| title_full | Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions |
| title_fullStr | Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions |
| title_full_unstemmed | Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions |
| title_short | Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions |
| title_sort | structural and optical studies of (ag₃ass₃)₀.₆(as₂s₃)₀.₄ thin films deposited at different technological conditions |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/118484 |
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